Inventor · disambiguated record
Cheol-Hong Park
Also filed as: PARK CHEOL HONG
8 granted patents·1 pending application·88 citations·filing 1999–2022
83Inventor score
Top patents by PatentIndex Score
9 records- 0197US9772555B2Methods of forming patterns using photoresistsSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Sep 26, 2017·52 cites·18 claims
- 0272US6658612B1Test signal generating circuit of a semiconductor device with pins receiving signals of multiple voltage levels and method for invoking test modesSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Dec 2, 2003·17 cites·14 claims
- 0371US7558993B2Test apparatus for semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jul 7, 2009·8 cites·19 claims
- 0460US10353290B2Photoresist composition for extreme ultraviolet and method of forming photoresist pattern using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jul 16, 2019·1 cites·12 claims
- 0558US2023288799A1Method of forming patternsSAMSUNG SDI CO LTD·Filed 2022·Application pending·0 cites
- 0652US9804493B2Composition for forming topcoat layer and resist pattern formation method employing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Oct 31, 2017·0 cites·10 claims
- 0740US10438810B2Method of forming photoresist pattern and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Oct 8, 2019·0 cites·13 claims
- 0840US6225818B1Integrated circuits including function identification circuits having operating modes that identify corresponding functions of the integrated circuitsSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted May 1, 2001·10 cites·4 claims
- 0938US9564325B2Methods of fabricating a semiconductor deviceKOH CHAWON·Filed 2014·Granted Feb 7, 2017·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →