Inventor · disambiguated record
Choonshik Leem
Also filed as: LEEM CHOONSHIK
6 granted patents·2 pending applications·8 citations·filing 2014–2024
73Inventor score
Top patents by PatentIndex Score
8 records- 0185US9612212B1Ellipsometer and method of inspecting pattern asymmetry using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Apr 4, 2017·5 cites·12 claims
- 0276US9719946B2Ellipsometer and method of inspecting pattern asymmetry using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Aug 1, 2017·2 cites·8 claims
- 0371US10949949B2Non-transitory computer-readable medium and method for monitoring a semiconductor fabrication processSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Mar 16, 2021·1 cites·20 claims
- 0456US2025061560A1Image processing for on-cell overlay measurementSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0553US2024353350A1Wafer abnormality detection method and a semiconductor device manufacturing method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0646US10373882B2Method and system of measuring semiconductor device and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Aug 6, 2019·0 cites·18 claims
- 0740US9991174B2Method and system of measuring semiconductor device and method of fabricating semiconductor device using the sameLEEM CHOONSHIK·Filed 2014·Granted Jun 5, 2018·0 cites·8 claims
- 0838US9360308B2Methods for measuring a thickness of an objectSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Jun 7, 2016·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →