Inventor · disambiguated record
Michael Weber-Grabau
Also filed as: WEBER-GRABAU MICHAEL
11 granted patents·2 pending applications·225 citations·filing 1987–2020
91Inventor score
Top patents by PatentIndex Score
13 records- 0193US9915732B2Object detection systemsONVECTOR TECH LLC·Filed 2016·Granted Mar 13, 2018·15 cites·27 claims
- 0293US4771172AMethod of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer operating in the chemical ionization modeFINNIGAN CORP·Filed 1987·Granted Sep 13, 1988·72 cites·7 claims
- 0391US4818869AMethod of isolating a single mass or narrow range of masses and/or enhancing the sensitivity of an ion trap mass spectrometerFINNIGAN CORP·Filed 1987·Granted Apr 4, 1989·55 cites·4 claims
- 0490US10261184B2Object detection systemsONVECTOR TECH LLC·Filed 2018·Granted Apr 16, 2019·6 cites·23 claims
- 0590US9335413B2Object detection systemsONVECTOR TECHNOLOGY LLC·Filed 2015·Granted May 10, 2016·17 cites·26 claims
- 0689US10585192B2Object detection systemsONVECTOR TECH LLC·Filed 2019·Granted Mar 10, 2020·5 cites·24 claims
- 0781US7249002B1Direct relative motion measurement for vibration induced noise and drift cancellationKLA TENCOR TECH CORP·Filed 2004·Granted Jul 24, 2007·31 cites·25 claims
- 0863US6919958B2Wafer metrology apparatus and methodTHERMA WAVE INC·Filed 2003·Granted Jul 19, 2005·7 cites·3 claims
- 0960US10914837B2Object detection systemsWEBER GRABAU MICHAEL·Filed 2020·Granted Feb 9, 2021·0 cites·22 claims
- 1059US7430898B1Methods and systems for analyzing a specimen using atomic force microscopy profiling in combination with an optical techniqueKLA TENCOR TECH CORP·Filed 2004·Granted Oct 7, 2008·17 cites·16 claims
- 1153US2020367483A1Method and system for recording and/or monitoring populations of insectsBIOGENTS AG·Filed 2019·Application pending·0 cites
- 1239US2002018217A1Optical critical dimension metrology system integrated into semiconductor wafer process toolFiled 2001·Application pending·0 cites
- 1331US6572456B2Bathless wafer measurement apparatus and methodSENSYS INSTR CORP·Filed 2001·Granted Jun 3, 2003·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →