Inventor · disambiguated record
Keith Golke
Also filed as: GOLKE KEITH · GOLKE KEITH W
22 granted patents·6 pending applications·535 citations·filing 1982–2021
95Inventor score
Top patents by PatentIndex Score
28 records- 0196US4837520AFuse status detection circuitHONEYWELL INC·Filed 1987·Granted Jun 6, 1989·114 cites·21 claims
- 0293US5631863ARandom access memory cell resistant to radiation induced upsetsHONEYWELL INC·Filed 1996·Granted May 20, 1997·145 cites·9 claims
- 0393US4420790AHigh sensitivity variable capacitance transducerHONEYWELL INC·Filed 1982·Granted Dec 13, 1983·65 cites·39 claims
- 0486US6058041ASEU hardening circuitHONEYWELL INC·Filed 1998·Granted May 2, 2000·65 cites·22 claims
- 0574US7322015B2Simulating a dose rate event in a circuit designHONEYWELL INT INC·Filed 2005·Granted Jan 22, 2008·7 cites·23 claims
- 0674US6608512B2Full rail drive enhancement to differential SEU hardening circuitHONEYWELL INT INC·Filed 2001·Granted Aug 19, 2003·28 cites·53 claims
- 0771US6180984B1Integrated circuit impedance device and method of manufacture thereforHONEYWELL INC·Filed 1998·Granted Jan 30, 2001·30 cites·25 claims
- 0864US7693001B2SRAM split write control for a delay elementHONEYWELL INT INC·Filed 2008·Granted Apr 6, 2010·5 cites·5 claims
- 0962US7964897B2Direct contact to area efficient body tie process flowHONEYWELL INT INC·Filed 2008·Granted Jun 21, 2011·2 cites·20 claims
- 1062US6909637B2Full rail drive enhancement to differential SEU hardening circuit while loading dataHONEYWELL INT INC·Filed 2002·Granted Jun 21, 2005·13 cites·56 claims
- 1160US8217458B2Non-aligned antenna effect protection circuit with single event transient hardnessGOLKE KEITH·Filed 2009·Granted Jul 10, 2012·4 cites·20 claims
- 1255US5867039ACMOS output driver with p-channel substrate tracking for cold spare capabilityHONEYWELL INC·Filed 1996·Granted Feb 2, 1999·14 cites·17 claims
- 1353US8451062B2Radiation hardened differential amplifierSEEFELDT JAMES D·Filed 2011·Granted May 28, 2013·2 cites·18 claims
- 1453US6300666B1Method for forming a frontside contact to the silicon substrate of a SOI wafer in the presence of planarized contact dielectricsHONEYWELL INC·Filed 1998·Granted Oct 9, 2001·23 cites·17 claims
- 1552US9165633B2Carbon nanotube memory cell with enhanced current controlHONEYWELL INT INC·Filed 2013·Granted Oct 20, 2015·1 cites·14 claims
- 1652US8570061B2(N-1)-out-of-N voter mux with enhanced driveGOLKE KEITH·Filed 2011·Granted Oct 29, 2013·1 cites·15 claims
- 1748US11600318B2Memory array with reduced leakage currentHONEYWELL INT INC·Filed 2021·Granted Mar 7, 2023·0 cites·20 claims
- 1844US2009230440A1Single event transient hardened majority carrier field effect transistorHONEYWELL INT INC·Filed 2009·Application pending·0 cites
- 1942US4761571AMemory circuit enchancement to stablize the signal lines with additional capacitanceHONEYWELL INC·Filed 1985·Granted Aug 2, 1988·8 cites·23 claims
- 2041US9842991B2Memory cell with redundant carbon nanotubeHONEYWELL INT INC·Filed 2013·Granted Dec 12, 2017·0 cites·9 claims
- 2138US2007162880A1Single event transient immune antenna diode circuitHONEYWELL INT INC·Filed 2006·Application pending·0 cites
- 2236US2007279964A1SRAM split write control for a delay elementHONEYWELL INT INC·Filed 2006·Application pending·0 cites
- 2336US2007096754A1Method and system for analyzing single event upset in semiconductor devicesHONEYWELL INT INC·Filed 2005·Application pending·0 cites
- 2436US2007063758A1Voltage divider and method for minimizing higher than rated voltagesHONEYWELL INT INC·Filed 2005·Application pending·0 cites
- 2535US2015117087A1Self-terminating write for a memory cellHONEYWELL INT INC·Filed 2013·Application pending·0 cites
- 2634US5309389ARead-only memory with complementary data linesHONEYWELL INC·Filed 1993·Granted May 3, 1994·6 cites·10 claims
- 2733US8767444B2Radiation-hardened memory element with multiple delay elementsNELSON DAVID·Filed 2006·Granted Jul 1, 2014·0 cites·7 claims
- 2822US5410501ARead-only memoryHONEYWELL INC·Filed 1993·Granted Apr 25, 1995·2 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →