Inventor · disambiguated record
Hisashi Hatano
Also filed as: HATANO HISASHI
26 granted patents·1 pending application·124 citations·filing 1988–2023
94Inventor score
Top patents by PatentIndex Score
27 records- 0195US7369223B2Method of apparatus for detecting particles on a specimenHITACHI HIGH TECH CORP·Filed 2005·Granted May 6, 2008·25 cites·5 claims
- 0288USD886741SHolder for solenoid valvesCKD CORP·Filed 2018·Granted Jun 9, 2020·33 cites·1 claims
- 0387US10861145B2Defect inspection device and defect inspection methodHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 8, 2020·4 cites·9 claims
- 0486USD319798SFire detectorNITTAN CO LTD·Filed 1988·Granted Sep 10, 1991·25 cites·1 claims
- 0579US8289507B2Method of apparatus for detecting particles on a specimenHAMAMATSU AKIRA·Filed 2011·Granted Oct 16, 2012·2 cites·12 claims
- 0679US7817261B2Method of apparatus for detecting particles on a specimenHITACHI HIGH TECH CORP·Filed 2008·Granted Oct 19, 2010·4 cites·14 claims
- 0778US7952700B2Method of apparatus for detecting particles on a specimenHITACHI HIGH TECH CORP·Filed 2010·Granted May 31, 2011·2 cites·12 claims
- 0867US10466181B2Flaw inspection device and flaw inspection methodHITACHI HIGH TECH CORP·Filed 2016·Granted Nov 5, 2019·1 cites·15 claims
- 0958US9488596B2Defect inspection method and device for sameHITACHI HIGH TECH CORP·Filed 2015·Granted Nov 8, 2016·0 cites·8 claims
- 1057US10816484B2Flaw inspection device and flaw inspection methodHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 27, 2020·0 cites·8 claims
- 1157US9255888B2Defect inspection method and device for sameHITACHI HIGH TECH CORP·Filed 2012·Granted Feb 9, 2016·0 cites·13 claims
- 1256US9964500B2Defect inspection device, display device, and defect classification deviceHITACHI HIGH TECH CORP·Filed 2014·Granted May 8, 2018·0 cites·16 claims
- 1356US2016178360A1Surface shape measuring apparatusHITACHI HIGH TECH CORP·Filed 2016·Application pending·0 cites
- 1455US12404946B2Solenoid valve manifoldCKD CORP·Filed 2023·Granted Sep 2, 2025·0 cites·5 claims
- 1553US11971112B1Electromagnetic valve manifoldCKD CORP·Filed 2023·Granted Apr 30, 2024·0 cites·6 claims
- 1653US11808393B2ManifoldCKD CORP·Filed 2020·Granted Nov 7, 2023·0 cites·5 claims
- 1752US9933370B2Inspection apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Apr 3, 2018·0 cites·7 claims
- 1851US9310190B2Surface shape measuring apparatusITO MASAAKI·Filed 2012·Granted Apr 12, 2016·0 cites·13 claims
- 1950US12247593B2Solenoid valve manifoldCKD CORP·Filed 2023·Granted Mar 11, 2025·0 cites·3 claims
- 2050USD883214SConnector for solenoid valvesCKD CORP·Filed 2018·Granted May 5, 2020·5 cites·1 claims
- 2148US5403539AMethod and apparatus for molding inflation filmSHOWA DENKO KK·Filed 1993·Granted Apr 4, 1995·14 cites·7 claims
- 2246USD884637SConnector for solenoid valvesCKD CORP·Filed 2018·Granted May 19, 2020·4 cites·1 claims
- 2339USD867990SPower supply unitCKD CORP·Filed 2018·Granted Nov 26, 2019·2 cites·1 claims
- 2439US8902417B2Inspection apparatusHIROSE NOBUAKI·Filed 2011·Granted Dec 2, 2014·0 cites·16 claims
- 2538USD886102SData transmission deviceCKD CORP·Filed 2018·Granted Jun 2, 2020·2 cites·1 claims
- 2636US9182359B2Apparatus and method for inspecting pattern defectHATANO HISASHI·Filed 2010·Granted Nov 10, 2015·0 cites·6 claims
- 2733USD883978SData communication deviceCKD CORP·Filed 2018·Granted May 12, 2020·1 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →