Inventor · disambiguated record
Peter G. Kaup
Also filed as: KAUP PETER G
24 granted patents·2 pending applications·430 citations·filing 2008–2019
96Inventor score
Top patents by PatentIndex Score
26 records- 0198US10408890B2Pulsed RF methods for optimization of CW measurementsLOCKHEED CORP·Filed 2017·Granted Sep 10, 2019·29 cites·14 claims
- 0298US10408889B2Apparatus and method for recovery of three dimensional magnetic field from a magnetic detection systemLOCKHEED CORP·Filed 2017·Granted Sep 10, 2019·23 cites·38 claims
- 0398US10359479B2Efficient thermal drift compensation in DNV vector magnetometryLOCKHEED CORP·Filed 2017·Granted Jul 23, 2019·26 cites·28 claims
- 0498US10345396B2Selected volume continuous illumination magnetometerLOCKHEED CORP·Filed 2016·Granted Jul 9, 2019·27 cites·14 claims
- 0598US10241158B2Apparatus and method for estimating absolute axes' orientations for a magnetic detection systemLOCKHEED CORP·Filed 2016·Granted Mar 26, 2019·23 cites·29 claims
- 0698US9541610B2Apparatus and method for recovery of three dimensional magnetic field from a magnetic detection systemLOCKHEED CORP·Filed 2016·Granted Jan 10, 2017·78 cites·20 claims
- 0797US10126377B2Magneto-optical defect center magnetometerLOCKHEED CORP·Filed 2017·Granted Nov 13, 2018·21 cites·28 claims
- 0896US10677953B2Magneto-optical detecting apparatus and methodsLOCKHEED CORP·Filed 2017·Granted Jun 9, 2020·30 cites·20 claims
- 0996US10459041B2Magnetic detection system with highly integrated diamond nitrogen vacancy sensorLOCKHEED CORP·Filed 2017·Granted Oct 29, 2019·12 cites·129 claims
- 1096US10168393B2Micro-vacancy center deviceLOCKHEED CORP·Filed 2015·Granted Jan 1, 2019·28 cites·16 claims
- 1196US9910105B2DNV magnetic field detectorLOCKHEED CORP·Filed 2016·Granted Mar 6, 2018·44 cites·43 claims
- 1296US9910104B2DNV magnetic field detectorLOCKHEED CORP·Filed 2016·Granted Mar 6, 2018·38 cites·32 claims
- 1393US10564231B1RF windowing for magnetometryLOCKHEED CORP·Filed 2019·Granted Feb 18, 2020·8 cites·20 claims
- 1493US10228429B2Apparatus and method for resonance magneto-optical defect center material pulsed mode referencingLOCKHEED CORP·Filed 2017·Granted Mar 12, 2019·6 cites·32 claims
- 1591US10371765B2Geolocation of magnetic sources using vector magnetometer sensorsLOCKHEED CORP·Filed 2017·Granted Aug 6, 2019·4 cites·18 claims
- 1690US10816616B2Phase shifted magnetometry adaptive cancellationLOCKHEED CORP·Filed 2018·Granted Oct 27, 2020·4 cites·29 claims
- 1787US10274550B2High speed sequential cancellation for pulsed modeLOCKHEED CORP·Filed 2017·Granted Apr 30, 2019·3 cites·20 claims
- 1882US9201141B1Multiple simultaneous transmit track beams using phase-only pattern synthesisMANICKAM ARUL·Filed 2012·Granted Dec 1, 2015·11 cites·20 claims
- 1975US10725124B2DNV magnetic field detectorLOCKHEED CORP·Filed 2018·Granted Jul 28, 2020·4 cites·20 claims
- 2074US10379174B2Bias magnet array for magnetometerLOCKHEED CORP·Filed 2017·Granted Aug 13, 2019·1 cites·39 claims
- 2174US7859451B2Method and system for monopulse radar target angle determinationLOCKHEED CORP·Filed 2008·Granted Dec 28, 2010·10 cites·20 claims
- 2257US2017343621A1Magneto-optical defect center magnetometerLOCKHEED CORP·Filed 2017·Application pending·0 cites
- 2343US10838021B2Apparatus and method for simultaneous ramsey vector magnetometryLOCKHEED CORP·Filed 2018·Granted Nov 17, 2020·0 cites·27 claims
- 2443US10338163B2Multi-frequency excitation schemes for high sensitivity magnetometry measurement with drift error compensationLOCKHEED CORP·Filed 2016·Granted Jul 2, 2019·0 cites·31 claims
- 2542US11187765B2Apparatus and method for lower magnetometer drift with increased accuracyLOCKHEED CORP·Filed 2018·Granted Nov 30, 2021·0 cites·30 claims
- 2639US2017343619A1Two-stage optical dnv excitationLOCKHEED CORP·Filed 2016·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Peter G. Kaup files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →