Inventor · disambiguated record
Sho Takami
Also filed as: TAKAMI SHO
13 granted patents·100 citations·filing 1996–2010
91Inventor score
Top patents by PatentIndex Score
13 records- 0192US7187345B2Image forming method and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2005·Granted Mar 6, 2007·14 cites·6 claims
- 0289US7817105B2Image forming method and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Oct 19, 2010·9 cites·19 claims
- 0383US6512228B2Scanning electron microscopeHITACHI LTD·Filed 2002·Granted Jan 28, 2003·17 cites·3 claims
- 0482US6444981B1Scanning electron microscopeHITACHI LTD·Filed 1999·Granted Sep 3, 2002·34 cites·18 claims
- 0577US7435958B2Electron beam apparatus and method for production of its specimen chamberHITACHI HIGH TECH CORP·Filed 2006·Granted Oct 14, 2008·3 cites·3 claims
- 0670US7795581B2Pattern measuring method and electron microscopeHITACHI HIGH TECH CORP·Filed 2008·Granted Sep 14, 2010·2 cites·6 claims
- 0770US7030376B2Electron beam apparatus and method for production of its specimen chamberHITACHI HIGH TECH CORP·Filed 2003·Granted Apr 18, 2006·6 cites·2 claims
- 0859US8686380B2Charged particle beam apparatusKATAGIRI SOUICHI·Filed 2009·Granted Apr 1, 2014·1 cites·17 claims
- 0959US7566892B2Electron beam apparatus and method for production of its specimen chamberHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 28, 2009·0 cites·9 claims
- 1055US7205550B2Electron beam apparatus and method for production of its specimen chamberHITACHI HIGH TECH CORP·Filed 2006·Granted Apr 17, 2007·0 cites·4 claims
- 1153US5912462AElectron microscopeHITACHI LTD·Filed 1996·Granted Jun 15, 1999·10 cites·8 claims
- 1249US7091496B2Electron microscopic inspection apparatusHITACHI HIGH TECH CORP·Filed 2003·Granted Aug 15, 2006·4 cites·6 claims
- 1347US8203504B2Image forming method and charged particle beam apparatusKOBARU ATSUSHI·Filed 2010·Granted Jun 19, 2012·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →