Inventor · disambiguated record
William A. Heeschen
Also filed as: HEESCHEN WILLIAM A
7 granted patents·1 pending application·30 citations·filing 1991–2016
79Inventor score
Files withROHM & HAAS ELECT MATERIALS CMP HOLDINGS INC3DOW CHEMICAL CO1DOW GLOBAL TECHNOLOGIES INC1HARRIS J KEITH1HOOD LAWRENCE S1
Top patents by PatentIndex Score
8 records- 0184US9737971B2Chemical mechanical polishing pad, polishing layer analyzer and methodROHM & HAAS ELECT MATERIALS CMP HOLDINGS INC·Filed 2016·Granted Aug 22, 2017·4 cites·9 claims
- 0280US7843560B2Stable turbidity calibration standardsDOW GLOBAL TECHNOLOGIES INC·Filed 2008·Granted Nov 30, 2010·10 cites·16 claims
- 0377US8324287B2Positive skew styrene-acrylonitrile copolymer foamHOOD LAWRENCE S·Filed 2009·Granted Dec 4, 2012·3 cites·15 claims
- 0444US5311283AFiber optic probe and method for detecting optically active materialsDOW CHEMICAL CO·Filed 1991·Granted May 10, 1994·13 cites·33 claims
- 0543US2010118130A1Digital imaging systemHARRIS J KEITH·Filed 2009·Application pending·0 cites
- 0639US9770808B2Method of manufacturing chemical mechanical polishing padsROHM & HAAS ELECT MATERIALS CMP HOLDINGS INC·Filed 2016·Granted Sep 26, 2017·0 cites·9 claims
- 0737US8875562B2Filter and membrane defect detection systemWOOD STEWART P·Filed 2011·Granted Nov 4, 2014·0 cites·18 claims
- 0830US10272541B2Polishing layer analyzer and methodROHM & HAAS ELECT MATERIALS CMP HOLDINGS INC·Filed 2016·Granted Apr 30, 2019·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →