Inventor · disambiguated record
Harald A. Enge
Also filed as: ENGE HARALD · ENGE HARALD A · ENGE HARALD ANTON
14 granted patents·1 pending application·388 citations·filing 1976–2007
94Inventor score
Files withPURSER KENNETH H3ECLIPSE ION TECHNOLOGY INC1ENGE HARALD A1HIGH VOLTAGE ENGINEERING CORP1IND COILS INC1
Top patents by PatentIndex Score
15 records- 0198US4276477AFocusing apparatus for uniform application of charged particle beamVARIAN ASSOCIATES·Filed 1979·Granted Jun 30, 1981·112 cites·11 claims
- 0295US7301156B2Controlling the characteristics of implanter ion-beamsPURSER KENNETH H·Filed 2005·Granted Nov 27, 2007·25 cites·19 claims
- 0395US6933507B2Controlling the characteristics of implanter ion-beamsFiled 2003·Granted Aug 23, 2005·43 cites·14 claims
- 0488US7888660B2Controlling the characteristics of implanter ion-beamsPURSER KENNETH H·Filed 2006·Granted Feb 15, 2011·8 cites·32 claims
- 0588US7351984B2Controlling the characteristics of implanter ion-beamsVARIAN SEMICONDUCTOR EQUIPMENT·Filed 2007·Granted Apr 1, 2008·7 cites·11 claims
- 0686US5402094AMRI mammography magnetFiled 1994·Granted Mar 28, 1995·43 cites·13 claims
- 0782US4745281AIon beam fast parallel scanning having dipole magnetic lens with nonuniform fieldECLIPSE ION TECHNOLOGY INC·Filed 1986·Granted May 17, 1988·29 cites·11 claims
- 0882US4122346AOptical devices for computed transaxial tomographyHIGH VOLTAGE ENGINEERING CORP·Filed 1977·Granted Oct 24, 1978·20 cites·6 claims
- 0977US4393441AHigh voltage power supplyENGE HARALD A·Filed 1981·Granted Jul 12, 1983·30 cites·14 claims
- 1075US7897943B2Controlling the characteristics of implanter ion-beamsPURSER KENNETH H·Filed 2006·Granted Mar 1, 2011·2 cites·31 claims
- 1174US4063098ABeam scanning systemIND COILS INC·Filed 1976·Granted Dec 13, 1977·24 cites·13 claims
- 1260US5451790AMethod of treating waste or drinking water with high-energy electrons and apparatus thereforION PHYSICS CORP·Filed 1994·Granted Sep 19, 1995·24 cites·12 claims
- 1353US5508515AMass recombinator for accelerator mass spectrometryFiled 1995·Granted Apr 16, 1996·11 cites·10 claims
- 1449US5689112AApparatus for detection of surface contaminations on silicon wafersFiled 1996·Granted Nov 18, 1997·10 cites·10 claims
- 1537US2003001110A1System and method for amplifying an angle of divergence of a scanned ion beamFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →