Inventor · disambiguated record
Hongli Che
Also filed as: CHE HONGLI
10 granted patents·1 pending application·11 citations·filing 2013–2019
82Inventor score
Top patents by PatentIndex Score
11 records- 0181US10247693B2Disposable test sensor with improved sampling entranceCHANGSHA SINOCARE INC·Filed 2016·Granted Apr 2, 2019·4 cites·18 claims
- 0278US9518951B2Disposable test sensor with improved sampling entranceCAI XIAOHUA·Filed 2013·Granted Dec 13, 2016·4 cites·17 claims
- 0376US9523653B2Disposable test sensor with improved sampling entranceCHE HONGLI·Filed 2013·Granted Dec 20, 2016·2 cites·18 claims
- 0470US10571425B2Disposable test sensor with improved sampling entranceCHANGSHA SINOCARE INC·Filed 2019·Granted Feb 25, 2020·0 cites·20 claims
- 0569US9939401B2Test sensor with multiple sampling routesCAI XIAOHUA·Filed 2014·Granted Apr 10, 2018·1 cites·15 claims
- 0666US10527576B2Disposable test sensor with improved sampling entranceCHANGSHA SINOCARE INC·Filed 2018·Granted Jan 7, 2020·0 cites·20 claims
- 0760US10386323B2Test sensor with multiple sampling routesCHANGSHA SINOCARE INC·Filed 2018·Granted Aug 20, 2019·0 cites·20 claims
- 0859US10088444B2Disposable test sensor with improved sampling entranceCHANGSHA SINOCARE INC·Filed 2016·Granted Oct 2, 2018·0 cites·18 claims
- 0958US2019017956A1Disposable test sensorCHANGSHA SINOCARE INC·Filed 2018·Application pending·0 cites
- 1057US9897566B2Disposable test sensorCAI XIAOHUA·Filed 2014·Granted Feb 20, 2018·0 cites·18 claims
- 1129US10156538B2Control method and system for test strip electrodesSINOCARE INC·Filed 2015·Granted Dec 18, 2018·0 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →