Inventor · disambiguated record
Naoya Nakai
Also filed as: NAKAI NAOYA
4 granted patents·3 pending applications·11 citations·filing 2011–2024
67Inventor score
Top patents by PatentIndex Score
7 records- 0191US11959735B2Height measuring device and beam irradiation deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Apr 16, 2024·4 cites·19 claims
- 0288US10641607B2Height detection apparatus and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted May 5, 2020·5 cites·12 claims
- 0363US9851548B2Optical microscope device and testing apparatus comprising sameSHIMURA KEI·Filed 2012·Granted Dec 26, 2017·2 cites·7 claims
- 0463US2025253122A1Measurement device and scanning image acquisition methodHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 0555US2025157785A1Charged particle beam device adjustment method and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2023·Application pending·0 cites
- 0650US9104118B2Exposure device and method for producing structureHITACHI HIGH TECH CORP·Filed 2012·Granted Aug 11, 2015·0 cites·6 claims
- 0739US2013088590A1Far infrared imaging device and imaging method using sameSHIMURA KEI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →