Inventor · disambiguated record
Tzu-Sou Chuang
Also filed as: CHUANG TZU-SOU
13 granted patents·7 pending applications·5 citations·filing 2008–2025
83Inventor score
Top patents by PatentIndex Score
20 records- 0191US11892382B2Method for detecting environmental parameter in semiconductor fabrication facilityTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Feb 6, 2024·2 cites·20 claims
- 0281US2025296052A1Filter apparatus for semiconductor device fabrication processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0380US12343684B2Filter apparatus for semiconductor device fabrication processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jul 1, 2025·0 cites·20 claims
- 0475US2025108417A1Airborne contaminant management method and systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0572US2024384881A1Makeup air handling unit in semiconductor fabrication building and method for cleaning air using the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0672US2024304480A1Measuring system and method of measuring static chargesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0770US11826709B2Filter apparatus for semiconductor device fabrication processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Nov 28, 2023·0 cites·20 claims
- 0870US2024175788A1Method for detecting environmental parameter in semiconductor fabrication facilityTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0968US12202015B2Airborne contaminant management method and systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jan 21, 2025·0 cites·20 claims
- 1067US12020962B2Measuring system and method of measuring static chargesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 25, 2024·0 cites·20 claims
- 1166US12140342B2Makeup air handling unit in semiconductor fabrication building and method for cleaning air using the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Nov 12, 2024·0 cites·20 claims
- 1263US8394156B2Ultra-pure air system for nano wafer environmentCHUANG TZU-SOU·Filed 2008·Granted Mar 12, 2013·3 cites·21 claims
- 1353US10746635B2Method and apparatus for inspecting process solution, and sample preparation apparatus in inspectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Aug 18, 2020·0 cites·20 claims
- 1453US9352263B2Mechanisms for air treatment system and air treatment methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted May 31, 2016·0 cites·20 claims
- 1550US12251786B2Filter apparatus for semiconductor device fabrication processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Mar 18, 2025·0 cites·20 claims
- 1645US8629356B2Magnetic field shielding raised floor panelYU CHWEN·Filed 2011·Granted Jan 14, 2014·0 cites·20 claims
- 1745US2025178153A1Apparatus for manufacturing semiconductor device, semiconductor device manufacturing system, and filter deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1843US9958424B2Method of identifying airborne molecular contamination sourceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2012·Granted May 1, 2018·0 cites·20 claims
- 1936US9714887B2Detection method for substance and system thereofKUO CHI-WEN·Filed 2012·Granted Jul 25, 2017·0 cites·16 claims
- 2031US2016320359A1System and method for monitoring contaminationsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →