Inventor · disambiguated record
Yoshiaki Ogiso
Also filed as: OGISO YOSHIAKI
10 granted patents·42 citations·filing 1994–2012
85Inventor score
Top patents by PatentIndex Score
10 records- 0176US8779359B2Defect review apparatus and defect review methodOGISO YOSHIAKI·Filed 2011·Granted Jul 15, 2014·6 cites·14 claims
- 0268US8431895B2Pattern measuring apparatus and pattern measuring methodMATSUMOTO JUN·Filed 2010·Granted Apr 30, 2013·2 cites·12 claims
- 0363US8809778B2Pattern inspection apparatus and methodOGINO RYUICHI·Filed 2012·Granted Aug 19, 2014·3 cites·11 claims
- 0462US8507858B2Pattern measurement apparatus and pattern measurement methodADVANTEST CORP·Filed 2012·Granted Aug 13, 2013·1 cites·16 claims
- 0561US8071943B2Mask inspection apparatus and image creation methodMURAKAWA TSUTOMU·Filed 2009·Granted Dec 6, 2011·1 cites·10 claims
- 0660US8559697B2Mask inspection apparatus and image generation methodMURAKAWA TSUTOMU·Filed 2011·Granted Oct 15, 2013·1 cites·12 claims
- 0757US5999005AVoltage and displacement measuring apparatus and probeFUJITSU LTD·Filed 1997·Granted Dec 7, 1999·18 cites·7 claims
- 0846US5677635AVoltage and displacement measuring apparatus and probeFUJITSU LTD·Filed 1994·Granted Oct 14, 1997·10 cites·10 claims
- 0938US8675948B2Mask inspection apparatus and mask inspection methodOGISO YOSHIAKI·Filed 2011·Granted Mar 18, 2014·0 cites·6 claims
- 1037US6546154B2Image detection method and length measurement apparatusADVANTEST CORP·Filed 2002·Granted Apr 8, 2003·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →