Inventor · disambiguated record
Kieran Mark Tracy
Also filed as: TRACY KIERAN · TRACY KIERAN M · TRACY KIERAN MARK
18 granted patents·6 pending applications·385 citations·filing 1999–2024
92Inventor score
Files withSUNPOWER CORP13FIRST SOLAR INC2MAXEON SOLAR PTE LTD2RIM SEUNG BUM2UNIV NORTH CAROLINA STATE2
Top patents by PatentIndex Score
24 records- 0197US9196758B2Solar cell emitter region fabrication with differentiated p-type and n-type region architecturesSUNPOWER CORP·Filed 2013·Granted Nov 24, 2015·34 cites·11 claims
- 0297US6255198B1Methods of fabricating gallium nitride microelectronic layers on silicon layers and gallium nitride microelectronic structures formed therebyUNIV NORTH CAROLINA STATE·Filed 1999·Granted Jul 3, 2001·275 cites·53 claims
- 0394US6602764B2Methods of fabricating gallium nitride microelectronic layers on silicon layersUNIV NORTH CAROLINA STATE·Filed 2001·Granted Aug 5, 2003·68 cites·26 claims
- 0492US9634177B2Solar cell emitter region fabrication with differentiated P-type and N-type region architecturesRIM SEUNG BUM·Filed 2015·Granted Apr 25, 2017·6 cites·11 claims
- 0586US12495639B2Tri-layer semiconductor stacks for patterning features on solar cellsMAXEON SOLAR PTE LTD·Filed 2024·Granted Dec 9, 2025·0 cites·20 claims
- 0680US10230329B2Photonic degradation monitoring for semiconductor devicesSUNPOWER CORP·Filed 2017·Granted Mar 12, 2019·1 cites·20 claims
- 0779US11935972B2Tri-layer semiconductor stacks for patterning features on solar cellsMAXEON SOLAR PTE LTD·Filed 2022·Granted Mar 19, 2024·0 cites·20 claims
- 0876US11355654B2Tri-layer semiconductor stacks for patterning features on solar cellsSUNPOWER CORP·Filed 2019·Granted Jun 7, 2022·0 cites·20 claims
- 0971US11502208B2Solar cell emitter region fabrication with differentiated P-type and N-type region architecturesSUNPOWER CORP·Filed 2019·Granted Nov 15, 2022·0 cites·20 claims
- 1068US10505068B2Tri-layer semiconductor stacks for patterning features on solar cellsSUNPOWER CORP·Filed 2019·Granted Dec 10, 2019·0 cites·20 claims
- 1167US10804843B2Photonic degradation monitoring for semiconductor devicesSUNPOWER CORP·Filed 2019·Granted Oct 13, 2020·0 cites·20 claims
- 1266US10950740B2Solar cells having differentiated P-type and N-type architecturesSUNPOWER CORP·Filed 2018·Granted Mar 16, 2021·0 cites·20 claims
- 1365US10026861B2Photovoltaic device and method of formationFIRST SOLAR INC·Filed 2012·Granted Jul 17, 2018·1 cites·48 claims
- 1462US10030303B2Sputter toolSUNPOWER CORP·Filed 2014·Granted Jul 24, 2018·0 cites·19 claims
- 1561US2017222072A1Solar cell emitter region fabrication with differentiated p-type and n-type region architecturesRIM SEUNG BUM·Filed 2017·Application pending·0 cites
- 1655US10217878B2Tri-layer semiconductor stacks for patterning features on solar cellsSUNPOWER CORP·Filed 2016·Granted Feb 26, 2019·0 cites·12 claims
- 1755US9564854B2Photonic degradation monitoring for semiconductor devicesTU XIUWEN·Filed 2015·Granted Feb 7, 2017·0 cites·20 claims
- 1853US10141462B2Solar cells having differentiated P-type and N-type architecturesSUNPOWER CORP·Filed 2016·Granted Nov 27, 2018·0 cites·9 claims
- 1953US2014261667A1Photovoltaic device having improved back electrode and method of formationFIRST SOLAR INC·Filed 2014·Application pending·0 cites
- 2051US2015380581A1Passivation of light-receiving surfaces of solar cells with crystalline siliconJOHNSON MICHAEL C·Filed 2014·Application pending·0 cites
- 2150US2018040746A1Passivation of light-receiving surfaces of solar cells with high energy gap (eg) materialsSUNPOWER CORP·Filed 2017·Application pending·0 cites
- 2248US9825191B2Passivation of light-receiving surfaces of solar cells with high energy gap (EG) materialsSUNPOWER CORP·Filed 2014·Granted Nov 21, 2017·0 cites·20 claims
- 2338US2018138354A1Solar cell curing toolSUNPOWER CORP·Filed 2017·Application pending·0 cites
- 2437US2004029365A1Methods of fabricating gallium nitride microelectronic layers on silicon layers and gallium nitride microelectronic structures formed therebyFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →