Inventor · disambiguated record
Patrick R. Hansen
Also filed as: HANSEN PATRICK · HANSEN PATRICK R
14 granted patents·800 citations·filing 1997–2002
94Inventor score
Files withIBM14
Top patents by PatentIndex Score
14 records- 0196US6163862AOn-chip test circuit for evaluating an on-chip signal using an external test signalIBM·Filed 1997·Granted Dec 19, 2000·459 cites·20 claims
- 0295US6731179B2System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI)IBM·Filed 2002·Granted May 4, 2004·96 cites·20 claims
- 0390US6133749AVariable impedance output driver circuit using analog biases to match driver output impedance to load input impedanceIBM·Filed 1999·Granted Oct 17, 2000·68 cites·13 claims
- 0489US6509778B2BIST circuit for variable impedance systemIBM·Filed 2001·Granted Jan 21, 2003·43 cites·14 claims
- 0583US6714113B1Inductor for integrated circuitsIBM·Filed 2000·Granted Mar 30, 2004·43 cites·11 claims
- 0666US6278339B2Termination resistance independent system for impedance matching in high speed input-output chip interfacingIBM·Filed 2000·Granted Aug 21, 2001·9 cites·18 claims
- 0759US6542418B2Redundant memory array having dual-use repair elementsIBM·Filed 2001·Granted Apr 1, 2003·10 cites·20 claims
- 0853US6441646B1Structure and method of alternating precharge in dynamic SOI circuitsIBM·Filed 2001·Granted Aug 27, 2002·6 cites·11 claims
- 0951US6501293B2Method and apparatus for programmable active termination of input/output devicesIBM·Filed 1999·Granted Dec 31, 2002·27 cites·2 claims
- 1049US6617986B2Area efficient, sequential gray code to thermometer code decoderIBM·Filed 2001·Granted Sep 9, 2003·7 cites·18 claims
- 1149US6140885AOn-chip automatic system for impedance matching in very high speed input-output chip interfacingIBM·Filed 1999·Granted Oct 31, 2000·24 cites·15 claims
- 1236US6249193B1Termination impedance independent system for impedance matching in high speed input-output chip interfacingIBM·Filed 1999·Granted Jun 19, 2001·7 cites·10 claims
- 1330US6269461B1Testing method for dynamic logic keeper deviceIBM·Filed 1998·Granted Jul 31, 2001·0 cites·6 claims
- 1430US6181155B1Method and apparatus for testing dynamic logic using an improved reset pulseIBM·Filed 1999·Granted Jan 30, 2001·1 cites·8 claims
Join the waitlist — get patent alerts
Get an alert when Patrick R. Hansen files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →