Inventor · disambiguated record
Kazuhiro Shibano
Also filed as: SHIBANO KAZUHIRO
4 granted patents·22 citations·filing 1998–2019
68Inventor score
Top patents by PatentIndex Score
4 records- 0150US11902813B2Measurement result receiving apparatus, measuring apparatus, and method, program, and recording medium for the sameADVANTEST CORP·Filed 2019·Granted Feb 13, 2024·0 cites·3 claims
- 0250US6288955B1Methods and systems for testing integrated circuit memory devices by overlappiing test result loading and test result analysisSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Sep 11, 2001·16 cites·20 claims
- 0334US6034905AApparatus for testing semiconductor memory deviceTOSHIBA KK·Filed 1998·Granted Mar 7, 2000·6 cites·7 claims
- 0425US8601329B2Test apparatus and test methodDOI MASARU·Filed 2010·Granted Dec 3, 2013·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →