Inventor · disambiguated record
Richard W. Oldrey
Also filed as: OLDREY RICHARD · OLDREY RICHARD W · OLDREY RICHARD WALTER
10 granted patents·3 pending applications·155 citations·filing 1992–2020
88Inventor score
Top patents by PatentIndex Score
13 records- 0187US5373109AElectrical cable having flat, flexible, multiple conductor sectionsIBM·Filed 1992·Granted Dec 13, 1994·90 cites·4 claims
- 0285US8089285B2Implementing tamper resistant integrated circuit chipsHSU LOUIS L·Filed 2009·Granted Jan 3, 2012·15 cites·23 claims
- 0380US6894522B2Specific site backside underlaying and micromasking method for electrical characterization of semiconductor devicesIBM·Filed 2003·Granted May 17, 2005·29 cites·15 claims
- 0477US8701511B2Inert gas delivery system for electrical inspection apparatusOLDREY RICHARD WALTER·Filed 2011·Granted Apr 22, 2014·4 cites·10 claims
- 0571US11226372B2Portable chip tester with integrated field programmable gate arrayIBM·Filed 2019·Granted Jan 18, 2022·1 cites·19 claims
- 0659US11940271B2High power device fault localization via die surface contouringIBM·Filed 2020·Granted Mar 26, 2024·0 cites·20 claims
- 0757US9052338B2Inert gas delivery system for electrical inspection apparatusIBM·Filed 2013·Granted Jun 9, 2015·0 cites·3 claims
- 0849US7112983B2Apparatus and method for single die backside probing of semiconductor devicesIBM·Filed 2004·Granted Sep 26, 2006·6 cites·20 claims
- 0941US2007008293A1Touch sensitive device and displayIBM·Filed 2005·Application pending·0 cites
- 1040US5380955ADevice for passing a member through a sealed chamber wallIBM·Filed 1992·Granted Jan 10, 1995·10 cites·9 claims
- 1140US2008272474A1Apparatus for integrated circuit cooling during testing and image based analysisIBM·Filed 2008·Application pending·0 cites
- 1236US7269029B2Rapid fire test boardIBM·Filed 2004·Granted Sep 11, 2007·0 cites·13 claims
- 1336US2007164426A1Apparatus and method for integrated circuit cooling during testing and image based analysisIBM·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →