Inventor · disambiguated record
Makoto Sakuma
Also filed as: SAKUMA MAKOTO
34 granted patents·6 pending applications·323 citations·filing 2001–2015
97Inventor score
Top patents by PatentIndex Score
40 records- 0193US7026684B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2004·Granted Apr 11, 2006·81 cites·20 claims
- 0292US7528046B2Method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2007·Granted May 5, 2009·19 cites·9 claims
- 0389US7122430B2Nonvolatile semiconductor memory and manufacturing method for the sameTOSHIBA KK·Filed 2005·Granted Oct 17, 2006·15 cites·3 claims
- 0488US7298006B2Nonvolatile semiconductor memory device including improved gate electrodeTOSHIBA KK·Filed 2006·Granted Nov 20, 2007·12 cites·15 claims
- 0587US7149116B2Nonvolatile semiconductor memory and programming method for the sameTOSHIBA KK·Filed 2006·Granted Dec 12, 2006·12 cites·7 claims
- 0686US7122866B2Semiconductor memory device with a stacked gate including a floating gate and a control gate and method of manufacturing the sameTOSHIBA KK·Filed 2005·Granted Oct 17, 2006·15 cites·13 claims
- 0784US7679108B2Semiconductor memory and fabrication method for the sameTOSHIBA KK·Filed 2006·Granted Mar 16, 2010·11 cites·9 claims
- 0883US8133867B2Method for treating rheumatoid arthritis with an antibody that binds to a hepatocyte growth factor receptorOTSUKA AKIRA·Filed 2007·Granted Mar 13, 2012·6 cites·9 claims
- 0982US7505312B2Nonvolatile semiconductor memory device capable of controlling proximity effect due to coupling between adjacent charge storage layersTOSHIBA KK·Filed 2006·Granted Mar 17, 2009·16 cites·9 claims
- 1081US7078763B2Nonvolatile semiconductor memory device including improved gate electrodeTOSHIBA KK·Filed 2003·Granted Jul 18, 2006·27 cites·20 claims
- 1179US7291875B2Semiconductor device with double barrier filmTOSHIBA KK·Filed 2006·Granted Nov 6, 2007·6 cites·22 claims
- 1279US7078813B2Semiconductor device with double barrier filmTOSHIBA KK·Filed 2004·Granted Jul 18, 2006·19 cites·13 claims
- 1378US7027329B2Nonvolatile semiconductor memory and programming method for the sameTOSHIBA KK·Filed 2004·Granted Apr 11, 2006·20 cites·11 claims
- 1477US7122858B2Nonvolatile semiconductor memory device including improved gate electrodeTOSHIBA KK·Filed 2005·Granted Oct 17, 2006·5 cites·16 claims
- 1574US7382649B2Nonvolatile semiconductor memoryTOSHIBA KK·Filed 2005·Granted Jun 3, 2008·5 cites·3 claims
- 1672US7728435B2Semiconductor device with double barrier filmTOSHIBA KK·Filed 2008·Granted Jun 1, 2010·3 cites·22 claims
- 1772US7701742B2Semiconductor deviceTOSHIBA KK·Filed 2007·Granted Apr 20, 2010·3 cites·16 claims
- 1872US7071511B2Nonvolatile semiconductor memory device having adjacent selection transistors connected togetherTOSHIBA KK·Filed 2004·Granted Jul 4, 2006·14 cites·9 claims
- 1970US7012295B2Semiconductor memory with peripheral transistors having gate insulator thickness being thinner than thickness of memory and select transistorsTOSHIBA KK·Filed 2004·Granted Mar 14, 2006·13 cites·17 claims
- 2067US7521749B2Nonvolatile semiconductor memory device including improved gate electrodeTOSHIBA KK·Filed 2007·Granted Apr 21, 2009·2 cites·10 claims
- 2166US7649221B2Nonvolatile semiconductor memory and a fabrication method for the sameTOSHIBA KK·Filed 2007·Granted Jan 19, 2010·2 cites·17 claims
- 2263US7586786B2Nonvolatile semiconductor memoryTOSHIBA KK·Filed 2008·Granted Sep 8, 2009·2 cites·7 claims
- 2359US7335938B2Nonvolatile semiconductor memory and a fabrication method for the sameTOSHIBA KK·Filed 2004·Granted Feb 26, 2008·6 cites·10 claims
- 2458US7994642B2Semiconductor device which includes contact plug and embedded interconnection connected to contact plugTOSHIBA KK·Filed 2009·Granted Aug 9, 2011·1 cites·21 claims
- 2556US6844116B2Transfer sheet for transferring protective layer for photographic emulsion face and photomask with protective layerJUJO PAPER CO LTD·Filed 2001·Granted Jan 18, 2005·5 cites·20 claims
- 2652US7560320B2Nonvolatile semiconductor memory and a fabrication method for the sameTOSHIBA KK·Filed 2007·Granted Jul 14, 2009·0 cites·5 claims
- 2750US7998812B2Semiconductor deviceTOSHIBA KK·Filed 2010·Granted Aug 16, 2011·0 cites·11 claims
- 2849US7019355B2Nonvolatile semiconductor memory and a fabrication method thereofTOSHIBA KK·Filed 2004·Granted Mar 28, 2006·3 cites·18 claims
- 2949US2008061357A1Semiconductor device with double barrier filmSAKUMA MAKOTO·Filed 2007·Application pending·0 cites
- 3048US8313997B2Method of manufacturing a semiconductor memory using two exposure masks to form a same wiring layerSAKUMA MAKOTO·Filed 2012·Granted Nov 20, 2012·0 cites·20 claims
- 3147US8129776B2Semiconductor deviceSAKUMA MAKOTO·Filed 2011·Granted Mar 6, 2012·0 cites·19 claims
- 3247US7416935B2Method of manufacturing nonvolatile semiconductor memory device having adjacent selection transistors connected togetherTOSHIBA KK·Filed 2006·Granted Aug 26, 2008·0 cites·13 claims
- 3346US7393747B2Nonvolatile semiconductor memory and a fabrication method thereofTOSHIBA KK·Filed 2006·Granted Jul 1, 2008·0 cites·2 claims
- 3445US2008083947A1Semiconductor device and method of fabricating the sameTOSHIBA KK·Filed 2007·Application pending·0 cites
- 3544US2008006885A1Semiconductor integrated circuit device and method of manufacturingARAI FUMITAKA·Filed 2007·Application pending·0 cites
- 3642US7541654B2Semiconductor memory device and semiconductor device including multilayer gate electrodeTOSHIBA KK·Filed 2006·Granted Jun 2, 2009·0 cites·7 claims
- 3740US7534682B2Semiconductor memory device with a stacked gate including a floating gate and a control gate and method of manufacturing the sameTOSHIBA KK·Filed 2006·Granted May 19, 2009·0 cites·14 claims
- 3840US2009242960A1Semiconductor memory device and manufacturing method thereofSAKUMA MAKOTO·Filed 2009·Application pending·0 cites
- 3935US2005083744A1Semiconductor memory device with MOS transistors each having a floating gate and a control gateFiled 2004·Application pending·0 cites
- 4034US2016181148A1Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →