Inventor · disambiguated record
Naohito Kohashi
Also filed as: KOHASHI NAOHITO
10 granted patents·100 citations·filing 2002–2011
89Inventor score
Top patents by PatentIndex Score
10 records- 0191US7471096B2Contactor for electronic parts and a contact methodFUJITSU LTD·Filed 2006·Granted Dec 30, 2008·28 cites·10 claims
- 0284US6767219B2Contactor, method for manufacturing such contactor, and testing method using such contactorFUJITSU LTD·Filed 2002·Granted Jul 27, 2004·30 cites·34 claims
- 0379US8268670B2Method of semiconductor device protectionTASHIRO KAZUHIRO·Filed 2011·Granted Sep 18, 2012·4 cites·2 claims
- 0473US6784657B2Handling apparatus and test set using the handling apparatusFUJITSU LTD·Filed 2002·Granted Aug 31, 2004·18 cites·25 claims
- 0572US7977961B2Component for testing device for electronic component and testing method of the electronic componentFUJITSU SEMICONDUCTOR LTD·Filed 2009·Granted Jul 12, 2011·4 cites·7 claims
- 0666US7825676B2Contactor and test method using contactorFUJITSU SEMICONDUCTOR LTD·Filed 2007·Granted Nov 2, 2010·5 cites·17 claims
- 0766US7807481B2Method of semiconductor device protection, package of semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2008·Granted Oct 5, 2010·2 cites·3 claims
- 0863US7921906B2Temperature control method and temperature control deviceFUJITSU SEMICONDUCTOR LTD·Filed 2006·Granted Apr 12, 2011·2 cites·4 claims
- 0961US7382046B2Semiconductor device protection cover, and semiconductor device unit including the coverFUJITSU LTD·Filed 2004·Granted Jun 3, 2008·7 cites·16 claims
- 1049US8164181B2Semiconductor device packaging structureTASHIRO KAZUHIRO·Filed 2010·Granted Apr 24, 2012·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →