Inventor · disambiguated record
Dirk Fuhrmann
Also filed as: FUHRMANN DIRK
15 granted patents·2 pending applications·90 citations·filing 2003–2010
91Inventor score
Top patents by PatentIndex Score
17 records- 0188US7313044B2Integrated semiconductor memory with temperature-dependent voltage generationINFINEON TECHNOLOGIES AG·Filed 2005·Granted Dec 25, 2007·24 cites·23 claims
- 0278US7330387B2Integrated semiconductor memory deviceINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 12, 2008·13 cites·10 claims
- 0378US7299388B2Method and apparatus for selectively accessing and configuring individual chips of a semi-conductor waferINFINEON TECHNOLOGIES AG·Filed 2005·Granted Nov 20, 2007·7 cites·14 claims
- 0465US6882556B2Semiconductor memory having a configuration of memory cellsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Apr 19, 2005·12 cites·11 claims
- 0561US7457177B2Random access memory including circuit to compress comparison resultsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Nov 25, 2008·5 cites·21 claims
- 0660US8496858B2Self-supporting optical fiber spool and method for the production thereofBRENNER AXEL·Filed 2008·Granted Jul 30, 2013·4 cites·14 claims
- 0758US8561564B2Device and method for launching an underwater moving bodyBRENNER AXEL·Filed 2010·Granted Oct 22, 2013·5 cites·13 claims
- 0857US7313033B2Random access memory including first and second voltage sourcesINFINEON TECHNOLOGIES AG·Filed 2005·Granted Dec 25, 2007·4 cites·29 claims
- 0949US7082513B2Integrated memory and method for checking the functioning of an integrated memoryINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 25, 2006·6 cites·15 claims
- 1049US7057224B2Semiconductor memory having an arrangement of memory cellsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jun 6, 2006·4 cites·29 claims
- 1147US7362632B2Test parallelism increase by tester controllable switching of chip select groupsINFINEON TECHNOLOGIES AG·Filed 2006·Granted Apr 22, 2008·2 cites·20 claims
- 1241US7443740B2Integrated semiconductor memory with adjustable internal voltageINFINEON TECHNOLOGIES AG·Filed 2006·Granted Oct 28, 2008·2 cites·12 claims
- 1341US7136295B2Semiconductor arrangementINFINEON TECHNOLOGIES AG·Filed 2005·Granted Nov 14, 2006·0 cites·26 claims
- 1438US6963514B2Method for testing an integrated semiconductor memory, and integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Nov 8, 2005·2 cites·16 claims
- 1534US7197679B2Method for testing an integrated semiconductor memory with a shortened reading timeINFINEON TECHNOLOGIES AG·Filed 2005·Granted Mar 27, 2007·0 cites·13 claims
- 1632US2004057307A1Self-test circuit and a method for testing a memory with the self-test circuitFiled 2003·Application pending·0 cites
- 1731US2004057302A1Test circuit of an integrated memory circuit for coding assessment data and method for testing the memory circuitFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →