Inventor · disambiguated record
Peilin Song
Also filed as: SONG PEILIN
86 granted patents·4 pending applications·735 citations·filing 1999–2022
99Inventor score
Top patents by PatentIndex Score
90 records- 0195US9088278B2Physical unclonable function generation and managementIBM·Filed 2013·Granted Jul 21, 2015·19 cites·8 claims
- 0295US8115170B2Method and apparatus for creating time-resolved emission images of integrated circuits using a single-point single-photon detector and a scanning systemSTELLARI FRANCO·Filed 2007·Granted Feb 14, 2012·57 cites·34 claims
- 0394US7355429B2On-chip power supply noise detectorIBM·Filed 2005·Granted Apr 8, 2008·26 cites·13 claims
- 0492US9568540B2Method for the characterization and monitoring of integrated circuitsIBM·Filed 2014·Granted Feb 14, 2017·7 cites·13 claims
- 0592US8741713B2Reliable physical unclonable function for device authenticationBRULEY JOHN·Filed 2012·Granted Jun 3, 2014·23 cites·23 claims
- 0692US7355435B2On-chip detection of power supply vulnerabilitiesIBM·Filed 2005·Granted Apr 8, 2008·20 cites·4 claims
- 0791US11715195B2Machine learning-based circuit board inspectionIBM·Filed 2021·Granted Aug 1, 2023·2 cites·17 claims
- 0891US8635582B2Navigating analytical tools using layout softwareSTELLARI FRANCO·Filed 2012·Granted Jan 21, 2014·13 cites·11 claims
- 0991US6516432B1AC scan diagnostic methodIBM·Filed 1999·Granted Feb 4, 2003·103 cites·16 claims
- 1090US9184751B2Physical unclonable function generation and managementIBM·Filed 2013·Granted Nov 10, 2015·8 cites·19 claims
- 1189US11587890B2Tamper-resistant circuit, back-end of the line memory and physical unclonable function for supply chain protectionIBM·Filed 2020·Granted Feb 21, 2023·2 cites·20 claims
- 1289US9337837B2Physical unclonable function generation and managementGLOBALFOUNDRIES US 2 LLC·Filed 2015·Granted May 10, 2016·5 cites·16 claims
- 1388US6490702B1Scan structure for improving transition fault coverage and scan diagnosticsIBM·Filed 1999·Granted Dec 3, 2002·72 cites·11 claims
- 1487US11508438B1RRAM filament location based on NIR emissionIBM·Filed 2020·Granted Nov 22, 2022·2 cites·20 claims
- 1587US9874601B2Integrated time dependent dielectric breakdown reliability testingIBM·Filed 2016·Granted Jan 23, 2018·2 cites·19 claims
- 1687US7443187B2On-chip power supply noise detectorIBM·Filed 2007·Granted Oct 28, 2008·12 cites·9 claims
- 1786US8131056B2Constructing variability maps by correlating off-state leakage emission images to layout informationPOLONSKY STANISLAV·Filed 2008·Granted Mar 6, 2012·11 cites·25 claims
- 1886US7952370B2On-chip detection of power supply vulnerabilitiesIBM·Filed 2010·Granted May 31, 2011·5 cites·14 claims
- 1985US9261561B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2015·Granted Feb 16, 2016·2 cites·20 claims
- 2085US8041437B2System and method for virtual control of laboratory equipmentIBM·Filed 2008·Granted Oct 18, 2011·15 cites·22 claims
- 2185US7480882B1Measuring and predicting VLSI chip reliability and failureIBM·Filed 2008·Granted Jan 20, 2009·14 cites·1 claims
- 2284US10302697B2Automated scan chain diagnostics using emissionIBM·Filed 2015·Granted May 28, 2019·3 cites·19 claims
- 2383US8331726B2Creating emission images of integrated circuitsSTELLARI FRANCO·Filed 2009·Granted Dec 11, 2012·12 cites·25 claims
- 2483US7446550B2Enhanced signal observability for circuit analysisIBM·Filed 2007·Granted Nov 4, 2008·10 cites·14 claims
- 2583US6442720B1Technique to decrease the exposure time of infrared imaging of semiconductor chips for failure analysisIBM·Filed 1999·Granted Aug 27, 2002·50 cites·14 claims
- 2682US10591539B2Automated scan chain diagnostics using emissionIBM·Filed 2019·Granted Mar 17, 2020·1 cites·20 claims
- 2782US8312413B2Navigating analytical tools using layout softwareSTELLARI FRANCO·Filed 2010·Granted Nov 13, 2012·6 cites·11 claims
- 2881US10515183B2Integrated circuit identificationIBM·Filed 2017·Granted Dec 24, 2019·2 cites·11 claims
- 2981US7868606B2Process variation on-chip sensorIBM·Filed 2008·Granted Jan 11, 2011·8 cites·20 claims
- 3081US7646208B2On-chip detection of power supply vulnerabilitiesIBM·Filed 2008·Granted Jan 12, 2010·8 cites·11 claims
- 3181US7010735B2Stuck-at fault scan chain diagnostic methodIBM·Filed 2002·Granted Mar 7, 2006·31 cites·14 claims
- 3280US10515181B2Integrated circuit identificationIBM·Filed 2017·Granted Dec 24, 2019·2 cites·15 claims
- 3380US10429433B2Method for the characterization and monitoring of integrated circuitsIBM·Filed 2016·Granted Oct 1, 2019·1 cites·20 claims
- 3480US7378859B2System and method for estimation of integrated circuit signal characteristics using optical measurementsIBM·Filed 2005·Granted May 27, 2008·9 cites·10 claims
- 3578US10379152B2Method for the characterization and monitoring of integrated circuitsIBM·Filed 2016·Granted Aug 13, 2019·1 cites·12 claims
- 3678US7788058B2Method and apparatus for diagnosing broken scan chain based on leakage light emissionIBM·Filed 2008·Granted Aug 31, 2010·7 cites·24 claims
- 3778US6728914B2Random path delay testing methodologyCADENCE DESIGN SYSTEMS INC·Filed 2000·Granted Apr 27, 2004·22 cites·16 claims
- 3878US6662324B1Global transition scan based AC methodIBM·Filed 2000·Granted Dec 9, 2003·22 cites·15 claims
- 3977US6816990B2VLSI chip test power reductionIBM·Filed 2002·Granted Nov 9, 2004·21 cites·12 claims
- 4076US10102090B2Non-destructive analysis to determine use history of processorIBM·Filed 2016·Granted Oct 16, 2018·2 cites·20 claims
- 4175US9581642B2Method and system for quickly identifying circuit components in an emission imageSONG PEILIN·Filed 2010·Granted Feb 28, 2017·3 cites·22 claims
- 4274US9448277B2Integrated time dependent dielectric breakdown reliability testingCHEN JIFENG·Filed 2012·Granted Sep 20, 2016·2 cites·7 claims
- 4374US8412993B2Self-adjusting critical path timing of multi-core VLSI chipSONG PEILIN·Filed 2010·Granted Apr 2, 2013·4 cites·24 claims
- 4473US10147175B2Detection of hardware trojan using light emissions with sacrificial maskIBM·Filed 2017·Granted Dec 4, 2018·2 cites·20 claims
- 4572US7089474B2Method and system for providing interactive testing of integrated circuitsIBM·Filed 2004·Granted Aug 8, 2006·17 cites·20 claims
- 4671US10928448B2Automated scan chain diagnostics using emissionIBM·Filed 2019·Granted Feb 23, 2021·0 cites·20 claims
- 4769US11169200B2Method for the characterization and monitoring of integrated circuitsIBM·Filed 2019·Granted Nov 9, 2021·0 cites·20 claims
- 4869US11061063B2Method for the characterization and monitoring of integrated circuitsIBM·Filed 2019·Granted Jul 13, 2021·0 cites·20 claims
- 4969US9086457B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2013·Granted Jul 21, 2015·1 cites·20 claims
- 5068US9075106B2Detecting chip alterations with light emissionBERNSTEIN KERRY·Filed 2009·Granted Jul 7, 2015·5 cites·19 claims
Showing the top 50 of 90 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Peilin Song files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →