Inventor · disambiguated record
Woo Jung Ahn
Also filed as: AHN WOO JUNG
6 granted patents·1 pending application·34 citations·filing 1998–2012
76Inventor score
Top patents by PatentIndex Score
7 records- 0162US6005669ANon contact measuring method for three dimensional micro pattern in measuring objectPAHK HEUI JAE·Filed 1998·Granted Dec 21, 1999·27 cites·5 claims
- 0257US8279447B2Method for measuring thicknessPAHK HEUI-JAE·Filed 2008·Granted Oct 2, 2012·3 cites·9 claims
- 0357US8199332B2Apparatus for measuring thicknessPAHK HEUI-JAE·Filed 2008·Granted Jun 12, 2012·3 cites·5 claims
- 0449US8116555B2Vision inspection system and method for inspecting workpiece using the sameAHN WOO JUNG·Filed 2008·Granted Feb 14, 2012·0 cites·18 claims
- 0544US8947673B2Estimating thickness based on number of peaks between two peaks in scanning white light interferometryPAHK HEUI JAE·Filed 2009·Granted Feb 3, 2015·1 cites·7 claims
- 0636US2012260855A1Depositing apparatus for forming thin filmCHO WHANG SIN·Filed 2012·Application pending·0 cites
- 0735US8416293B2Plasma monitoring device and methodSHIN HEUNG HYUN·Filed 2008·Granted Apr 9, 2013·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →