Inventor · disambiguated record
Hideki Yamawaki
Also filed as: YAMAWAKI HIDEKI
10 granted patents·3 pending applications·135 citations·filing 1987–2007
88Inventor score
Top patents by PatentIndex Score
13 records- 0180US5037774AProcess for the production of semiconductor devices utilizing multi-step deposition and recrystallization of amorphous siliconFUJITSU LTD·Filed 1987·Granted Aug 6, 1991·55 cites·15 claims
- 0278US6747317B2Semiconductor deviceFUJITSU LTD·Filed 2002·Granted Jun 8, 2004·18 cites·6 claims
- 0376US4931425AProcess for chemical vapor deposition of superconductive oxideFUJITSU LTD·Filed 1988·Granted Jun 5, 1990·40 cites·60 claims
- 0467US6790677B2Method of forming a ferroelectric film and fabrication process of a semiconductor device having a ferroelectric filmFUJITSU LTD·Filed 2003·Granted Sep 14, 2004·10 cites·14 claims
- 0560US7635395B2Solid material gasification methodFUJITSU LTD·Filed 2006·Granted Dec 22, 2009·0 cites·17 claims
- 0659US7883961B2Manufacturing method for ferroelectric memory deviceSEIKO EPSON CORP·Filed 2007·Granted Feb 8, 2011·1 cites·6 claims
- 0757US6943397B2Device having capacitor and its manufactureFUJITSU LTD·Filed 2003·Granted Sep 13, 2005·5 cites·19 claims
- 0848US7045473B2Solid material gasification method, thin film formation process and apparatusFUJITSU LTD·Filed 2003·Granted May 16, 2006·0 cites·15 claims
- 0943US2004140535A1Semiconductor device, method of forming epitaxial film, and laser ablation deviceFUJITSU LTD·Filed 2004·Application pending·0 cites
- 1042US6852551B2Method of forming a ferroelectric film and fabrication process of a semiconductor device having a ferroelectric filmFUJITSU LTD·Filed 2004·Granted Feb 8, 2005·0 cites·3 claims
- 1142US2005105038A1Thin film multilayer body, electronic device and actuator using the thin film multilayer body, and method of manufacturing the actuatorFUJITSU LTD·Filed 2004·Application pending·0 cites
- 1240US2005162595A1Optical deflection element and method of producing the sameFUJITSU LTD·Filed 2005·Application pending·0 cites
- 1334US5107119AMethod of evaluating characteristics of superconductors and process and apparatus for forming superconductor film by using the methodFUJITSU LTD·Filed 1991·Granted Apr 21, 1992·6 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →