Inventor · disambiguated record
Mitsunori Nishizawa
Also filed as: NISHIZAWA MITSUNORI
15 granted patents·70 citations·filing 1991–2021
90Inventor score
Files withHAMAMATSU PHOTONICS KK15
Top patents by PatentIndex Score
15 records- 0180US9562944B2Semiconductor device inspection device and semiconductor device inspection methodHAMAMATSU PHOTONICS KK·Filed 2014·Granted Feb 7, 2017·3 cites·25 claims
- 0277US9618550B2Apparatus for frequency analyzing a measurement target and method of frequency analyzing a measurement targetHAMAMATSU PHOTONICS KK·Filed 2014·Granted Apr 11, 2017·3 cites·18 claims
- 0377US9618576B2Apparatus for testing a semiconductor device and method of testing a semiconductor deviceHAMAMATSU PHOTONICS KK·Filed 2014·Granted Apr 11, 2017·3 cites·18 claims
- 0476US9618563B2Semiconductor device inspection device and semiconductor device inspection methodHAMAMATSU PHOTONICS KK·Filed 2014·Granted Apr 11, 2017·2 cites·12 claims
- 0567US5591962ASynchronous signal detection apparatus with a photoconductive photodetectorHAMAMATSU PHOTONICS KK·Filed 1995·Granted Jan 7, 1997·38 cites·8 claims
- 0663US7425694B2Time-resolved measurement apparatusHAMAMATSU PHOTONICS KK·Filed 2004·Granted Sep 16, 2008·5 cites·7 claims
- 0760US7619199B2Time-resolved measurement apparatus and position-sensitive election multiplier tubeHAMAMATSU PHOTONICS KK·Filed 2004·Granted Nov 17, 2009·4 cites·12 claims
- 0859US10101383B2Semiconductor device inspection device and semiconductor device inspection methodHAMAMATSU PHOTONICS KK·Filed 2017·Granted Oct 16, 2018·0 cites·12 claims
- 0958US10191104B2Semiconductor device inspection device and semiconductor device inspection methodHAMAMATSU PHOTONICS KK·Filed 2016·Granted Jan 29, 2019·0 cites·23 claims
- 1053US12320842B2Inspection device for a semiconductor deviceHAMAMATSU PHOTONICS KK·Filed 2021·Granted Jun 3, 2025·0 cites·7 claims
- 1149US10139447B2Image generation apparatus and image generation methodHAMAMATSU PHOTONICS KK·Filed 2015·Granted Nov 27, 2018·0 cites·12 claims
- 1246US10408874B2Light source device and inspection deviceHAMAMATSU PHOTONICS KK·Filed 2016·Granted Sep 10, 2019·0 cites·11 claims
- 1345US5204522AMethod for driving a photoelectric device and a method for driving an image intensifier using the photocathode deviceHAMAMATSU PHOTONICS KK·Filed 1991·Granted Apr 20, 1993·7 cites·4 claims
- 1434US5866897AOptical waveform detecting deviceHAMAMATSU PHOTONICS KK·Filed 1997·Granted Feb 2, 1999·5 cites·19 claims
- 1532US10962932B2Time measurement device, time measurement method, light-emission-lifetime measurement device, and light-emission-lifetime measurement methodHAMAMATSU PHOTONICS KK·Filed 2015·Granted Mar 30, 2021·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →