Inventor · disambiguated record
Teruhisa Nakamura
Also filed as: NAKAMURA TERUHISA
10 granted patents·182 citations·filing 1992–2007
88Inventor score
Top patents by PatentIndex Score
10 records- 0185US5287535ASwitching node in label multiplexing type switching networkFUJITSU LTD·Filed 1992·Granted Feb 15, 1994·112 cites·21 claims
- 0278US5693288ASeal assembly for thermal treatment furnaces using an atmospheric gas containing hydrogen gasNISSHIN STEEL CO LTD·Filed 1995·Granted Dec 2, 1997·40 cites·13 claims
- 0362US7379226B2Variable optical attenuatorFDK CORP·Filed 2007·Granted May 27, 2008·2 cites·6 claims
- 0448US5685088ASealing apparatus for inlet/outlet of atmosphere facilityNISSHIN STEEL CO LTD·Filed 1995·Granted Nov 11, 1997·6 cites·12 claims
- 0547US5842855ASealing apparatus for inlet/outlet of compartment of continuous heat treatment furnace, continuous vacuum evaporation facility or the likeNISSHIN STEEL CO LTD·Filed 1995·Granted Dec 1, 1998·7 cites·21 claims
- 0637US5791656ASeal assembly for heat treatment furnaces using an atmospheric gas containing hydrogen gasNISSHIN STEEL CO LTD·Filed 1996·Granted Aug 11, 1998·3 cites·8 claims
- 0733US5769629ASealing apparatus for inlet/outlet of atmosphere heat treatment furnaceNISSHIN STEEL CO LTD·Filed 1995·Granted Jun 23, 1998·2 cites·21 claims
- 0833US5658527AMethod of detection and treatment of fires in seal means of comparted entrance and exit of furnace for continuous thermal treatment of metallic strips and the likeNISSHIN STEEL CO LTD·Filed 1995·Granted Aug 19, 1997·7 cites·6 claims
- 0932US5683651AMethod and assembly for sealing up the entrance and exit of a heat-treating furnace operated in a gas atmosphere containing hydrogen gasNISSHIN STEEL CO LTD·Filed 1995·Granted Nov 4, 1997·2 cites·20 claims
- 1030US5678831ASealing device of compartment gateways of continuous annealing furnaces and continuous painting equipmentsNISSHIN STEEL CO LTD·Filed 1994·Granted Oct 21, 1997·1 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →