Inventor · disambiguated record
Jeffrey P. Erhardt
Also filed as: ERHARDT JEFFREY · ERHARDT JEFFREY P
17 granted patents·1 pending application·152 citations·filing 2000–2007
92Inventor score
Files withADVANCED MICRO DEVICES INC18
Top patents by PatentIndex Score
18 records- 0192US7101722B1In-line voltage contrast determination of tunnel oxide weakness in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2004·Granted Sep 5, 2006·81 cites·20 claims
- 0273US6350696B1Spacer etch method for semiconductor deviceADVANCED MICRO DEVICES INC·Filed 2000·Granted Feb 26, 2002·16 cites·3 claims
- 0366US6815233B1Method of simultaneous display of die and wafer characterization in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2003·Granted Nov 9, 2004·10 cites·20 claims
- 0458US6649525B1Methods and systems for controlling resist residue defects at gate layer in a semiconductor device manufacturing processADVANCED MICRO DEVICES INC·Filed 2002·Granted Nov 18, 2003·7 cites·15 claims
- 0557US7137085B1Wafer level global bitmap characterization in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2004·Granted Nov 14, 2006·8 cites·20 claims
- 0656US6770523B1Method for semiconductor wafer planarization by CMP stop layer formationADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 3, 2004·5 cites·20 claims
- 0754US7143370B1Parameter linking system for data visualization in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2003·Granted Nov 28, 2006·6 cites·20 claims
- 0851US7208382B1Semiconductor device with high conductivity region using shallow trenchADVANCED MICRO DEVICES INC·Filed 2002·Granted Apr 24, 2007·4 cites·14 claims
- 0950US7590309B1Image processing in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2004·Granted Sep 15, 2009·3 cites·9 claims
- 1047US6875560B1Testing multiple levels in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2003·Granted Apr 5, 2005·1 cites·20 claims
- 1146US7263451B1Method and apparatus for correlating semiconductor process data with known prior process dataADVANCED MICRO DEVICES INC·Filed 2004·Granted Aug 28, 2007·1 cites·20 claims
- 1246US2007166938A1Semiconductor device with high conductivity region using shallow trenchADVANCED MICRO DEVICES INC·Filed 2007·Application pending·0 cites
- 1344US7197435B1Method and apparatus for using clustering method to analyze semiconductor devicesADVANCED MICRO DEVICES INC·Filed 2004·Granted Mar 27, 2007·2 cites·16 claims
- 1443US6723605B1Method for manufacturing memory with high conductivity bitline and shallow trench isolation integrationADVANCED MICRO DEVICES INC·Filed 2001·Granted Apr 20, 2004·5 cites·21 claims
- 1541US6864107B1Determination of nonphotolithographic wafer process-splits in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2003·Granted Mar 8, 2005·0 cites·10 claims
- 1641US6766265B2Processing tester information by trellising in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2002·Granted Jul 20, 2004·0 cites·20 claims
- 1741US6759179B1Methods and systems for controlling resist residue defects at gate layer in a semiconductor device manufacturing processADVANCED MICRO DEVICES INC·Filed 2002·Granted Jul 6, 2004·2 cites·14 claims
- 1839US7099789B1Characterizing distribution signatures in integrated circuit technologyADVANCED MICRO DEVICES INC·Filed 2004·Granted Aug 29, 2006·1 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →