Inventor · disambiguated record
David F. Heidel
Also filed as: HEIDEL DAVID · HEIDEL DAVID F · HEIDEL DAVID FRANK
10 granted patents·184 citations·filing 1997–2010
90Inventor score
Top patents by PatentIndex Score
10 records- 0191US7084660B1System and method for accelerated detection of transient particle induced soft error rates in integrated circuitsIBM·Filed 2005·Granted Aug 1, 2006·32 cites·20 claims
- 0285US7480882B1Measuring and predicting VLSI chip reliability and failureIBM·Filed 2008·Granted Jan 20, 2009·14 cites·1 claims
- 0383US6230290B1Method of self programmed built in self testIBM·Filed 1997·Granted May 8, 2001·54 cites·20 claims
- 0472US7791330B2On-chip jitter measurement circuitIBM·Filed 2008·Granted Sep 7, 2010·5 cites·24 claims
- 0571US6108798ASelf programmed built in self testIBM·Filed 1997·Granted Aug 22, 2000·30 cites·15 claims
- 0669US7439724B2On-chip jitter measurement circuitIBM·Filed 2003·Granted Oct 21, 2008·12 cites·1 claims
- 0768US9075106B2Detecting chip alterations with light emissionBERNSTEIN KERRY·Filed 2009·Granted Jul 7, 2015·5 cites·19 claims
- 0867US6172512B1Image processing methods for the optical detection of dynamic errors in integrated circuitsIBM·Filed 1998·Granted Jan 9, 2001·29 cites·11 claims
- 0960US8362600B2Method and structure to reduce soft error rate susceptibility in semiconductor structuresIBM·Filed 2010·Granted Jan 29, 2013·1 cites·24 claims
- 1059US9165917B2In-line stacking of transistors for soft error rate hardeningCANNON ETHAN H·Filed 2009·Granted Oct 20, 2015·2 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →