Inventor · disambiguated record
Shoji Wada
Also filed as: WADA SHOJI
22 granted patents·4 pending applications·251 citations·filing 1978–2024
95Inventor score
Top patents by PatentIndex Score
26 records- 0191US9443737B2Method of forming metal contacts in the barrier layer of a group III-N HEMTTEXAS INSTRUMENTS INC·Filed 2013·Granted Sep 13, 2016·8 cites·14 claims
- 0287US9818839B2Method of forming metal contacts in the barrier layer of a group III-N HEMTTEXAS INSTRUMENTS INC·Filed 2016·Granted Nov 14, 2017·3 cites·16 claims
- 0386US4216628ADevice for automatically grinding syringe needle pointWADA SHOJI·Filed 1978·Granted Aug 12, 1980·25 cites·17 claims
- 0483US5150325ABi-CMOS semiconductor memory device, including improved layout structure and testing methodHITACHI LTD·Filed 1990·Granted Sep 22, 1992·45 cites·26 claims
- 0577US10374057B2Method of forming metal contacts in the barrier layer of a group III-N HEMTTEXAS INSTRUMENTS INC·Filed 2017·Granted Aug 6, 2019·1 cites·9 claims
- 0674US5831925AMemory configuration circuit and methodTEXAS INSTRUMENTS INC·Filed 1997·Granted Nov 3, 1998·38 cites·20 claims
- 0773US9679866B2Bonding stage and method of manufacturing the sameSHINKAWA KK·Filed 2016·Granted Jun 13, 2017·2 cites·2 claims
- 0872US11508688B2Bonding apparatus including a heater and a cooling flow path used for stacking a plurality of semiconductor chipsSHINKAWA KK·Filed 2017·Granted Nov 22, 2022·2 cites·15 claims
- 0972US2024274705A1Normally-on gallium nitride based transistor with p-type gateTEXAS INSTRUMENTS INC·Filed 2024·Application pending·0 cites
- 1068US5946245AMemory array test circuit and methodTEXAS INSTRUMENTS INC·Filed 1997·Granted Aug 31, 1999·27 cites·20 claims
- 1168US5276648ATesting method for a semiconductor memory deviceHITACHI LTD·Filed 1992·Granted Jan 4, 1994·21 cites·3 claims
- 1267US5598373ASemiconductor memory systemHITACHI LTD·Filed 1995·Granted Jan 28, 1997·29 cites·8 claims
- 1365US10707323B2Method of forming metal contacts in the barrier layer of a group III-N HEMTTEXAS INSTRUMENTS INC·Filed 2019·Granted Jul 7, 2020·0 cites·16 claims
- 1461US9640462B2Semiconductor device having wiring pad and wiring formed on the same wiring layerLONGITUDE SEMICONDUCTOR SARL·Filed 2012·Granted May 2, 2017·1 cites·23 claims
- 1560US11978790B2Normally-on gallium nitride based transistor with p-type gateTEXAS INSTRUMENTS INC·Filed 2020·Granted May 7, 2024·0 cites·24 claims
- 1654US10137519B2Flux reservoir apparatusSHINKAWA KK·Filed 2017·Granted Nov 27, 2018·0 cites·2 claims
- 1754US4430358AMethod of manufacturing a cut tube to be used for syringe needlesWADA SHOJI·Filed 1981·Granted Feb 7, 1984·15 cites·4 claims
- 1850US11521890B2Apparatus for manufacturing semiconductor deviceSHINKAWA KK·Filed 2018·Granted Dec 6, 2022·0 cites·8 claims
- 1950US2008304772A1Hydrostatic guide systemSHINKAWA KK·Filed 2008·Application pending·0 cites
- 2049US6166977AAddress controlled sense amplifier overdrive timing for semiconductor memory deviceTEXAS INSTRUMENTS INC·Filed 1999·Granted Dec 26, 2000·13 cites·31 claims
- 2147US6084809AMain amplifier circuit and input-output bus for a dynamic random access memoryHITACHI LTD·Filed 1997·Granted Jul 4, 2000·9 cites·11 claims
- 2247US5506804ADynamic Random Access Type Semiconductor DeviceHITACHI LTD·Filed 1993·Granted Apr 9, 1996·9 cites·9 claims
- 2346US11562916B2Mounting apparatus and temperature measurement methodSHINKAWA KK·Filed 2018·Granted Jan 24, 2023·0 cites·14 claims
- 2442US2013153899A1Semiconductor device having plural semiconductor chipsELPIDA MEMORY INC·Filed 2012·Application pending·0 cites
- 2541US2014302673A1Method of Forming Metal Contacts With Low Contact Resistances in a Group III-N HEMTTEXAS INSTRUMENTS INC·Filed 2013·Application pending·0 cites
- 2635US5304868ANon-inverting buffer circuit device and semiconductor memory circuit deviceHITACHI LTD·Filed 1991·Granted Apr 19, 1994·3 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →