Inventor · disambiguated record
Shigeto Isakozawa
Also filed as: ISAKOZAWA SHIGETO
40 granted patents·2 pending applications·885 citations·filing 1979–2008
98Inventor score
Top patents by PatentIndex Score
42 records- 0197US4451737AElectron beam control device for electron microscopesHITACHI LTD·Filed 1982·Granted May 29, 1984·72 cites·11 claims
- 0293US7250601B2Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring methodHITACHI HIGH TECH CORP·Filed 2006·Granted Jul 31, 2007·15 cites·8 claims
- 0391US7928376B2Element mapping unit, scanning transmission electron microscope, and element mapping methodHITACHI LTD·Filed 2005·Granted Apr 19, 2011·15 cites·9 claims
- 0491US5866905AElectron microscopeHITACHI LTD·Filed 1996·Granted Feb 2, 1999·74 cites·12 claims
- 0591US5367171AElectron microscope specimen holderHITACHI LTD·Filed 1992·Granted Nov 22, 1994·74 cites·19 claims
- 0690US6822233B2Method and apparatus for scanning transmission electron microscopyHITACHI LTD·Filed 2003·Granted Nov 23, 2004·31 cites·1 claims
- 0790US6566654B1Inspection of circuit patterns for defects and analysis of defects using a charged particle beamHITACHI LTD·Filed 2000·Granted May 20, 2003·34 cites·13 claims
- 0890US6531697B1Method and apparatus for scanning transmission electron microscopyHITACHI LTD·Filed 1999·Granted Mar 11, 2003·59 cites·9 claims
- 0990US6051834AElectron microscopeHITACHI LTD·Filed 1998·Granted Apr 18, 2000·65 cites·2 claims
- 1089US7476872B2Method and apparatus for observing inside structures, and specimen holderHITACHI LTD·Filed 2007·Granted Jan 13, 2009·9 cites·4 claims
- 1189US6703613B2Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring methodHITACHI LTD·Filed 2001·Granted Mar 9, 2004·28 cites·12 claims
- 1287US5783830ASample evaluation/process observation system and methodHITACHI LTD·Filed 1997·Granted Jul 21, 1998·85 cites·9 claims
- 1385US6794648B2Ultimate analyzer, scanning transmission electron microscope and ultimate analysis methodHITACHI LTD·Filed 2002·Granted Sep 21, 2004·19 cites·19 claims
- 1482US7067805B2Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring methodHITACHI HIGH TECH CORP·Filed 2004·Granted Jun 27, 2006·17 cites·3 claims
- 1581US8134131B2Method and apparatus for observing inside structures, and specimen holderTERADA SHOHEI·Filed 2008·Granted Mar 13, 2012·4 cites·3 claims
- 1681US6930306B2Electron microscopeHITACHI HIGH TECH CORP·Filed 2004·Granted Aug 16, 2005·15 cites·10 claims
- 1779US7923701B2Charged particle beam equipmentHITACHI HIGH TECH CORP·Filed 2008·Granted Apr 12, 2011·4 cites·14 claims
- 1879US7375330B2Charged particle beam equipmentHITACHI HIGH TECH CORP·Filed 2006·Granted May 20, 2008·4 cites·13 claims
- 1979US6150657AEnergy filter and electron microscope equipped with the energy filterHITACHI LTD·Filed 1998·Granted Nov 21, 2000·34 cites·15 claims
- 2078US5552602AElectron microscopeHITACHI LTD·Filed 1995·Granted Sep 3, 1996·41 cites·28 claims
- 2175US6933501B2Ultimate analyzer, scanning transmission electron microscope and ultimate analysis methodHITACHI LTD·Filed 2004·Granted Aug 23, 2005·10 cites·2 claims
- 2272US4680469AFocusing device for a television electron microscopeHITACHI LTD·Filed 1985·Granted Jul 14, 1987·18 cites·8 claims
- 2370US7372047B2Charged particle system and a method for measuring image magnificationHITACHI HIGH TECH CORP·Filed 2005·Granted May 13, 2008·2 cites·19 claims
- 2470US5981948ATransmission electron microscope and method of observing element distributionHITACHI LTD·Filed 1998·Granted Nov 9, 1999·21 cites·8 claims
- 2570US4698503AFocusing apparatus used in a transmission electron microscopeHITACHI LTD·Filed 1986·Granted Oct 6, 1987·17 cites·6 claims
- 2669US4945247AField emission electron gun systemHITACHI LTD·Filed 1989·Granted Jul 31, 1990·15 cites·6 claims
- 2766US5013915ATransmission type electron microscopeHITACHI LTD·Filed 1988·Granted May 7, 1991·13 cites·11 claims
- 2865US5059859ACharged particle beam generating apparatus of multi-stage acceleration typeHITACHI LTD·Filed 1990·Granted Oct 22, 1991·19 cites·33 claims
- 2965US4494000AImage distortion-free, image rotation-free electron microscopeHITACHI LTD·Filed 1982·Granted Jan 15, 1985·12 cites·21 claims
- 3063US5717207ATransmission electron microscope with camera systemHITACHI LTD·Filed 1996·Granted Feb 10, 1998·16 cites·30 claims
- 3161US7462830B2Method and apparatus for observing inside structures, and specimen holderHITACHI LTD·Filed 2004·Granted Dec 9, 2008·2 cites·21 claims
- 3259US4950909ASample tilting device in electron microscopeHITACHI LTD·Filed 1988·Granted Aug 21, 1990·11 cites·9 claims
- 3357US6855927B2Method and apparatus for observing element distributionHITACHI HIGH TECH CORP·Filed 2003·Granted Feb 15, 2005·3 cites·6 claims
- 3456US4480220AElectron energy analyzing apparatusHITACHI LTD·Filed 1981·Granted Oct 30, 1984·8 cites·12 claims
- 3547US5134289AField emission electron device which produces a constant beam currentHITACHI LTD·Filed 1990·Granted Jul 28, 1992·7 cites·16 claims
- 3642US2003085350A1Ultimate analyzer, scanning transmission electron microscope and ultimate analysis methodFiled 2001·Application pending·0 cites
- 3740US5142149AElectron microscopeHITACHI LTD·Filed 1990·Granted Aug 25, 1992·5 cites·4 claims
- 3838US7146872B2Micro manipulatorNAT INST OF ADVANCED IND SCIEN·Filed 2002·Granted Dec 12, 2006·0 cites·8 claims
- 3937US5008536AElectron microscope having electrical and mechanical position controls for specimen and positioning methodHITACHI LTD·Filed 1989·Granted Apr 16, 1991·3 cites·11 claims
- 4036US4283627AElectron microscopeHITACHI LTD·Filed 1979·Granted Aug 11, 1981·2 cites·10 claims
- 4135US4775790ATransmission electron microscopeHITACHI LTD·Filed 1986·Granted Oct 4, 1988·2 cites·8 claims
- 4230US2001045515A1Analysis electron microscopeFiled 1998·Application pending·0 cites
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