Inventor · disambiguated record
Hidemi Koike
Also filed as: KOIKE HIDEMI
41 granted patents·1,642 citations·filing 1980–2018
99Inventor score
Files withHITACHI LTD33HITACHI ULSI SYS CO LTD2TOKUDA MITSUO2HITACHI HIGH TECH CORP1NAT INST OF ADVANCED IND SCIEN1
Top patents by PatentIndex Score
41 records- 0199US6664552B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2001·Granted Dec 16, 2003·139 cites·2 claims
- 0298US6734687B1Apparatus for detecting defect in device and method of detecting defectHITACHI LTD·Filed 2000·Granted May 11, 2004·134 cites·10 claims
- 0397US6781125B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2001·Granted Aug 24, 2004·114 cites·14 claims
- 0496US7205560B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2005·Granted Apr 17, 2007·32 cites·27 claims
- 0596US7205554B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2005·Granted Apr 17, 2007·34 cites·5 claims
- 0696US6717156B2Beam as well as method and equipment for specimen fabricationHITACHI LTD·Filed 2002·Granted Apr 6, 2004·109 cites·19 claims
- 0796US4543465AMicrowave plasma source having improved switching operation from plasma ignition phase to normal ion extraction phaseHITACHI LTD·Filed 1983·Granted Sep 24, 1985·108 cites·11 claims
- 0895US7550750B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Jun 23, 2009·26 cites·32 claims
- 0995US6927391B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2004·Granted Aug 9, 2005·69 cites·4 claims
- 1094US7897936B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Mar 1, 2011·15 cites·15 claims
- 1194US7470918B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Dec 30, 2008·22 cites·15 claims
- 1294US7465945B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Dec 16, 2008·20 cites·7 claims
- 1393US6303932B1Method and its apparatus for detecting a secondary electron beam image and a method and its apparatus for processing by using focused charged particle beamHITACHI LTD·Filed 1998·Granted Oct 16, 2001·84 cites·19 claims
- 1493US4433228AMicrowave plasma sourceHITACHI LTD·Filed 1981·Granted Feb 21, 1984·43 cites·20 claims
- 1592US7888639B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Feb 15, 2011·14 cites·2 claims
- 1692US6960765B2Probe driving method, and probe apparatusHITACHI ULSI SYS CO LTD·Filed 2001·Granted Nov 1, 2005·50 cites·7 claims
- 1792US6794663B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2003·Granted Sep 21, 2004·33 cites·9 claims
- 1891US5053678AMicrowave ion sourceHITACHI LTD·Filed 1989·Granted Oct 1, 1991·48 cites·6 claims
- 1990US7268356B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2004·Granted Sep 11, 2007·28 cites·13 claims
- 2090US6566654B1Inspection of circuit patterns for defects and analysis of defects using a charged particle beamHITACHI LTD·Filed 2000·Granted May 20, 2003·34 cites·13 claims
- 2190US5976328APattern forming method using charged particle beam process and charged particle beam processing systemHITACHI LTD·Filed 1997·Granted Nov 2, 1999·58 cites·7 claims
- 2289US8222618B2Method and apparatus for processing a microsampleTOKUDA MITSUO·Filed 2011·Granted Jul 17, 2012·9 cites·18 claims
- 2389US4393333AMicrowave plasma ion sourceHITACHI LTD·Filed 1980·Granted Jul 12, 1983·38 cites·6 claims
- 2488US8618520B2Method and apparatus for processing a micro sampleTOKUDA MITSUO·Filed 2012·Granted Dec 31, 2013·7 cites·24 claims
- 2587US5783830ASample evaluation/process observation system and methodHITACHI LTD·Filed 1997·Granted Jul 21, 1998·85 cites·9 claims
- 2687US4409520AMicrowave discharge ion sourceHITACHI LTD·Filed 1981·Granted Oct 11, 1983·29 cites·8 claims
- 2785US6627889B2Apparatus and method for observing sample using electron beamHITACHI LTD·Filed 2002·Granted Sep 30, 2003·21 cites·4 claims
- 2884US6476387B1Method and apparatus for observing or processing and analyzing using a charged beamHITACHI LTD·Filed 1999·Granted Nov 5, 2002·44 cites·22 claims
- 2983US4658143AIon sourceHITACHI LTD·Filed 1985·Granted Apr 14, 1987·29 cites·33 claims
- 3082US4633138AIon implanterHITACHI LTD·Filed 1985·Granted Dec 30, 1986·43 cites·4 claims
- 3179US7301146B2Probe driving method, and probe apparatusHITACHI LTD·Filed 2005·Granted Nov 27, 2007·8 cites·16 claims
- 3278US6970004B2Apparatus for inspecting defects of devices and method of inspecting defectsHITACHI ULSI SYS CO LTD·Filed 2004·Granted Nov 29, 2005·18 cites·8 claims
- 3377US8796651B2Method and apparatus for specimen fabricationSHICHI HIROYASU·Filed 2011·Granted Aug 5, 2014·2 cites·12 claims
- 3477US5216253AIon implantation apparatus with variable width slits providing an ion beam of high purityHITACHI LTD·Filed 1991·Granted Jun 1, 1993·29 cites·17 claims
- 3576US4801847ACharged particle accelerator using quadrupole electrodesHITACHI LTD·Filed 1984·Granted Jan 31, 1989·26 cites·8 claims
- 3676US4316090AMicrowave plasma ion sourceHITACHI LTD·Filed 1980·Granted Feb 16, 1982·17 cites·8 claims
- 3770US8156852B2Cutting plotter, cutting plotter driving control device, cut target medium supporting sheet, cut target medium, cutting pen, method of manufacturing paper product, and method of generating cut dataSHIBATA TAKEYA·Filed 2005·Granted Apr 17, 2012·11 cites·14 claims
- 3852US6344115B1Pattern forming method using charged particle beam process and charged particle beam processing systemHITACHI LTD·Filed 1999·Granted Feb 5, 2002·8 cites·4 claims
- 3944US10955431B2Automatic analysis device with syringe pumpHITACHI HIGH TECH CORP·Filed 2018·Granted Mar 23, 2021·0 cites·9 claims
- 4040US4629930APlasma ion sourceHITACHI LTD·Filed 1983·Granted Dec 16, 1986·4 cites·5 claims
- 4138US7146872B2Micro manipulatorNAT INST OF ADVANCED IND SCIEN·Filed 2002·Granted Dec 12, 2006·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →