Inventor · disambiguated record
Junru Ruan
Also filed as: RUAN JUNRU
5 granted patents·2 pending applications·3 citations·filing 2008–2024
67Inventor score
Top patents by PatentIndex Score
7 records- 0190US11994845B2Determining a correction to a processASML NETHERLANDS BV·Filed 2021·Granted May 28, 2024·2 cites·20 claims
- 0280US12493285B2Determining a correction to a processASML NETHERLANDS BV·Filed 2024·Granted Dec 9, 2025·0 cites·20 claims
- 0369US11086305B2Determining a correction to a processASML NETHERLANDS BV·Filed 2021·Granted Aug 10, 2021·0 cites·28 claims
- 0463US2024402617A1Systems and methods for generating sem-quality metrology data from optical metrology data using machine learningASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0557US2024212125A1Patterning parameter determination using a charged particle inspection systemASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0655US8111379B2Automated determination of height and tilt of a substrate surface within a lithography systemRUAN JUNRU·Filed 2008·Granted Feb 7, 2012·1 cites·19 claims
- 0734US8729492B2Methods, devices, and systems for manipulating charged particle streamsRUAN JUNRU·Filed 2011·Granted May 20, 2014·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →