Inventor · disambiguated record
Geoffrey Duerden
Also filed as: DUERDEN GEOFFREY · DUERDEN GEOFFREY D
2 granted patents·1 pending application·29 citations·filing 2004–2008
61Inventor score
Technology areasG01R
Files withDFT MICROSYSTEMS INC3
Top patents by PatentIndex Score
3 records- 0183US7315574B2System and method for generating a jittered test signalDFT MICROSYSTEMS INC·Filed 2005·Granted Jan 1, 2008·16 cites·17 claims
- 0263US7242209B2System and method for testing integrated circuitsDFT MICROSYSTEMS INC·Filed 2004·Granted Jul 10, 2007·13 cites·58 claims
- 0333US2008192814A1System and Method for Physical-Layer Testing of High-Speed Serial Links in their Mission EnvironmentsDFT MICROSYSTEMS INC·Filed 2008·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Geoffrey Duerden files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →