Inventor · disambiguated record
John M. Mcintosh
Also filed as: MCINTOSH JOHN M · MCINTOSH JOHN MARTIN
22 granted patents·3 pending applications·459 citations·filing 1997–2005
96Inventor score
Top patents by PatentIndex Score
25 records- 0191US6641746B2Control of semiconductor processingAGERE SYSTEMS INC·Filed 2001·Granted Nov 4, 2003·48 cites·12 claims
- 0289US6893800B2Substrate topography compensation at mask design: 3D OPC topography anchoredAGERE SYSTEMS INC·Filed 2002·Granted May 17, 2005·67 cites·5 claims
- 0387US6651226B2Process control using three dimensional reconstruction metrologyAGERE SYSTEMS INC·Filed 2001·Granted Nov 18, 2003·29 cites·20 claims
- 0486US6985229B2Overlay metrology using scatterometry profilingAGERE SYSTEMS INC·Filed 2002·Granted Jan 10, 2006·47 cites·2 claims
- 0580US6569690B1Monitoring system for determining progress in a fabrication activityAGERE SYST GUARDIAN CORP·Filed 2000·Granted May 27, 2003·21 cites·9 claims
- 0677US6714892B2Three dimensional reconstruction metrologyAGERE SYSTEMS INC·Filed 2001·Granted Mar 30, 2004·15 cites·20 claims
- 0774US6258610B1Method analyzing a semiconductor surface using line width metrology with auto-correlation operationAGERE SYST GUARDIAN CORP·Filed 1999·Granted Jul 10, 2001·45 cites·12 claims
- 0874US6225639B1Method of monitoring a patterned transfer process using line width metrologyAGERE SYST GUARDIAN CORP·Filed 1999·Granted May 1, 2001·49 cites·21 claims
- 0970US6606371B2X-ray systemAGERE SYSTEMS INC·Filed 2000·Granted Aug 12, 2003·11 cites·10 claims
- 1069US6750447B2Calibration standard for high resolution electron microscopyAGERE SYSTEMS INC·Filed 2002·Granted Jun 15, 2004·8 cites·12 claims
- 1168US6727720B2Probe having a microstyletAGERE SYSTEMS INC·Filed 2001·Granted Apr 27, 2004·14 cites·11 claims
- 1267US6326618B1Method of analyzing semiconductor surface with patterned feature using line width metrologyAGERE SYST GUARDIAN CORP·Filed 1999·Granted Dec 4, 2001·28 cites·22 claims
- 1364US7972440B2Monitoring and control of a fabrication processAGERE SYSTEMS INC·Filed 2003·Granted Jul 5, 2011·10 cites·21 claims
- 1464US6577970B2Method of determining a crystallographic quality of a material located on a substrateAGERE SYSTEMS INC·Filed 2001·Granted Jun 10, 2003·5 cites·20 claims
- 1559US6097484ALocation of defects using dye penetrationLUCENT TECHNOLOGIES INC·Filed 1999·Granted Aug 1, 2000·20 cites·14 claims
- 1655US6369891B1Method of determining accuracy error in line width metrology deviceAGERE SYST GUARDIAN CORP·Filed 1999·Granted Apr 9, 2002·11 cites·14 claims
- 1753US6556703B1Scanning electron microscope system and method of manufacturing an integrated circuitAGERE SYSTEMS INC·Filed 1997·Granted Apr 29, 2003·16 cites·15 claims
- 1850USD536522SWrist/hand worn mirrorMCINTOSH JOHN M·Filed 2005·Granted Feb 13, 2007·9 cites·1 claims
- 1950US6633032B2Mass spectrometer particle counterAGERE SYSTEMS INC·Filed 2000·Granted Oct 14, 2003·2 cites·21 claims
- 2038US6708574B2Abnormal photoresist line/space profile detection through signal processing of metrology waveformAGERE SYSTEMS INC·Filed 2002·Granted Mar 23, 2004·0 cites·11 claims
- 2138US6627885B1Method of focused ion beam pattern transfer using a smart dynamic templateAGERE SYSTEMS INC·Filed 2000·Granted Sep 30, 2003·0 cites·11 claims
- 2236US2002150509A1Laboratory specimen sampler with integrated specimen mountFiled 2001·Application pending·0 cites
- 2335US6265235B1Method of sectioning of photoresist for shape evaluationLUCENT TECHNOLOGIES INC·Filed 1999·Granted Jul 24, 2001·4 cites·21 claims
- 2435US2003228755A1Method for metal patterning and improved linewidth controlFiled 2002·Application pending·0 cites
- 2534US2003184769A1Patterned implant metrologyFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →