Inventor · disambiguated record
Thomas G. Digges, Jr.
Also filed as: DIGGES JR THOMAS G · DIGGES THOMAS
8 granted patents·177 citations·filing 1973–2001
87Inventor score
Top patents by PatentIndex Score
8 records- 0188US5754294AOptical micrometer for measuring thickness of transparent wafersVIRGINIA SEMICONDUCTOR INC·Filed 1996·Granted May 19, 1998·71 cites·22 claims
- 0275US6080042AFlatness and throughput of single side polishing of wafersVIRGINIA SEMICONDUCTOR INC·Filed 1997·Granted Jun 27, 2000·45 cites·15 claims
- 0367US4140570AMethod of growing single crystal silicon by the Czochralski method which eliminates the need for post growth annealing for resistivity stabilizationTEXAS INSTRUMENTS INC·Filed 1973·Granted Feb 20, 1979·18 cites·10 claims
- 0462US5843832AMethod of formation of thin bonded ultra-thin wafersVIRGINIA SEMICONDUCTOR INC·Filed 1995·Granted Dec 1, 1998·35 cites·19 claims
- 0541US6554687B1Precise crystallographic-orientation alignment mark for a semiconductor waferVIRGINIA SEMICONDUCTOR INC·Filed 2001·Granted Apr 29, 2003·1 cites·20 claims
- 0637US6428618B2Method for forming a solid solution alloy crystalVIRGINIA SEMICONDUCTOR INC·Filed 2001·Granted Aug 6, 2002·1 cites·20 claims
- 0733US6159285AConverting <100> and <111> ingots to <110> ingotsVIRGINIA SEMICONDUCTOR INC·Filed 1999·Granted Dec 12, 2000·6 cites·25 claims
- 0821US6251181B1Method for forming a solid solution alloy crystalVIRGINIA SEMICONDUCTOR·Filed 1999·Granted Jun 26, 2001·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →