Inventor · disambiguated record
Hiroshi Kakibayashi
Also filed as: KAKIBAYASHI HIROSHI
18 granted patents·1 pending application·1,022 citations·filing 1991–2004
96Inventor score
Top patents by PatentIndex Score
19 records- 0198US6875984B2Bio electron microscope and observation method of specimenHITACHI LTD·Filed 2003·Granted Apr 5, 2005·105 cites·14 claims
- 0297US5332910ASemiconductor optical device with nanowhiskersHITACHI LTD·Filed 1993·Granted Jul 26, 1994·222 cites·24 claims
- 0392US5362972ASemiconductor device using whiskersHITACHI LTD·Filed 1991·Granted Nov 8, 1994·192 cites·48 claims
- 0491US5866905AElectron microscopeHITACHI LTD·Filed 1996·Granted Feb 2, 1999·74 cites·12 claims
- 0590US6822233B2Method and apparatus for scanning transmission electron microscopyHITACHI LTD·Filed 2003·Granted Nov 23, 2004·31 cites·1 claims
- 0690US6531697B1Method and apparatus for scanning transmission electron microscopyHITACHI LTD·Filed 1999·Granted Mar 11, 2003·59 cites·9 claims
- 0790US6051834AElectron microscopeHITACHI LTD·Filed 1998·Granted Apr 18, 2000·65 cites·2 claims
- 0889US6548811B1Transmission electron microscope apparatus with equipment for inspecting defects in specimen and method of inspecting defects in specimen using transmission electron microscopeHITACHI LTD·Filed 2000·Granted Apr 15, 2003·34 cites·7 claims
- 0980US7034299B2Transmission electron microscope system and method of inspecting a specimen using the sameHITACHI HIGH TECH CORP·Filed 2004·Granted Apr 25, 2006·15 cites·19 claims
- 1080US5453617AElectron microscope for specimen composition and strain analysis and observation method thereofHITACHI LTD·Filed 1994·Granted Sep 26, 1995·36 cites·22 claims
- 1178US5552602AElectron microscopeHITACHI LTD·Filed 1995·Granted Sep 3, 1996·41 cites·28 claims
- 1277US5650621AElectron microscopeHITACHI LTD·Filed 1995·Granted Jul 22, 1997·31 cites·8 claims
- 1373US5744800ADefect observing electron microscopeHITACHI LTD·Filed 1995·Granted Apr 28, 1998·27 cites·22 claims
- 1473US5475218AInstrument and method for 3-dimensional atomic arrangement observationHITACHI LTD·Filed 1993·Granted Dec 12, 1995·21 cites·8 claims
- 1572US5932880AScintillator device and image pickup apparatus using the sameHITACHI LTD·Filed 1997·Granted Aug 3, 1999·24 cites·18 claims
- 1671US5278408AInstrument and method for 3-dimensional atomic arrangement observationHITACHI LTD·Filed 1992·Granted Jan 11, 1994·27 cites·9 claims
- 1763US5717207ATransmission electron microscope with camera systemHITACHI LTD·Filed 1996·Granted Feb 10, 1998·16 cites·30 claims
- 1859US7145146B2Micro-spectroscopic measuring device and micro-chemical systemHITACHI LTD·Filed 2004·Granted Dec 5, 2006·2 cites·16 claims
- 1948US2004228774A1Microreactor, its production method, and sample screening deviceHITACHI LTD·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →