Inventor · disambiguated record
Bojan Ilic
Also filed as: ILIC BOJAN · ILIC BOJAN R · ILIC BOJAN ROBERT
10 granted patents·1 pending application·48 citations·filing 2003–2012
86Inventor score
Top patents by PatentIndex Score
11 records- 0186US8174352B2Method for making a transducer, transducer made therefrom, and applications thereofPARPIA JEEVAK M·Filed 2009·Granted May 8, 2012·18 cites·37 claims
- 0282US8695407B2Microtensiometer sensor, probe and method of useSTROOCK ABRAHAM D·Filed 2010·Granted Apr 15, 2014·9 cites·42 claims
- 0378US7229692B2Nanoconduits and nanoreplicantsUT BATTELLE LLC·Filed 2004·Granted Jun 12, 2007·11 cites·3 claims
- 0464US8539611B1Scanned probe microscopy (SPM) probe having angled tipREUTER MARK C·Filed 2012·Granted Sep 17, 2013·1 cites·15 claims
- 0564US8142877B2Nano transfer and nanoreplication using deterministically grown sacrificial nanotemplatesMELECHKO ANATOLI V·Filed 2007·Granted Mar 27, 2012·1 cites·13 claims
- 0660US8003220B2Nanotransfer and nanoreplication using deterministically grown sacrificial nanotemplatesUT BATTELLE LLC·Filed 2007·Granted Aug 23, 2011·0 cites·16 claims
- 0756US7943196B2Nanotransfer and nanoreplication using deterministically grown sacrificial nanotemplatesUT BATTELLE LLC·Filed 2005·Granted May 17, 2011·0 cites·17 claims
- 0854US8704315B2CMOS integrated micromechanical resonators and methods for fabricating the samePARPIA JEEVAK M·Filed 2009·Granted Apr 22, 2014·1 cites·30 claims
- 0954US7151256B2Vertically aligned nanostructure scanning probe microscope tipsUT BATTELLE LLC·Filed 2003·Granted Dec 19, 2006·7 cites·47 claims
- 1046US8893310B2Scanned probe microscopy (SPM) probe having angled tipREUTER MARK C·Filed 2012·Granted Nov 18, 2014·0 cites·19 claims
- 1141US2013062104A1Resonant material layer apparatus, method and applicationsCRAIGHEAD HAROLD G·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →