Inventor · disambiguated record
Gerard Luk-Pat
Also filed as: LUK-PAT GERARD · LUK-PAT GERARD T · LUK-PAT GERARD TERRENCE
4 granted patents·2 pending applications·20 citations·filing 2002–2024
70Inventor score
Top patents by PatentIndex Score
6 records- 0185US8826193B1Detection and removal of self-aligned double patterning artifactsSYNOPSYS INC·Filed 2013·Granted Sep 2, 2014·5 cites·42 claims
- 0265US7483559B2Method and apparatus for deblurring mask imagesSYNOPSYS INC·Filed 2004·Granted Jan 27, 2009·13 cites·25 claims
- 0362US2025284202A1Photolithographic mask pattern adjustment and devices fabricated therefromTEXAS INSTRUMENTS INC·Filed 2024·Application pending·0 cites
- 0461US8132128B2Method and system for performing lithography verification for a double-patterning processSONG HUA·Filed 2008·Granted Mar 6, 2012·2 cites·24 claims
- 0545US7478360B2Approximating wafer intensity change to provide fast mask defect scoringSYNOPSYS INC·Filed 2005·Granted Jan 13, 2009·0 cites·20 claims
- 0633US2003099286A1Method and system for shaping transmitted power spectral density according to line conditionsFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →