Inventor · disambiguated record
Takeshi Hoshi
Also filed as: HOSHI TAKESHI
15 granted patents·6 pending applications·82 citations·filing 2004–2022
91Inventor score
Top patents by PatentIndex Score
21 records- 0193US7238587B2Semiconductor device fabrication methodTOSHIBA KK·Filed 2005·Granted Jul 3, 2007·22 cites·18 claims
- 0289US7682927B2Method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2006·Granted Mar 23, 2010·16 cites·20 claims
- 0385US7598151B2Semiconductor device fabrication methodKABUSHKI KAISHA TOSHIBA·Filed 2007·Granted Oct 6, 2009·9 cites·10 claims
- 0482US7407864B2Polysilazane perhydride solution and method of manufacturing a semiconductor device using the sameTOSHIBA KK·Filed 2005·Granted Aug 5, 2008·7 cites·19 claims
- 0579US7538047B2Method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2006·Granted May 26, 2009·9 cites·28 claims
- 0678US9217731B2Welding inspection method and apparatus thereofYAMAMOTO SETSU·Filed 2011·Granted Dec 22, 2015·4 cites·18 claims
- 0776US8080463B2Semiconductor device manufacturing method and silicon oxide film forming methodIWASAWA KAZUAKI·Filed 2010·Granted Dec 20, 2011·5 cites·15 claims
- 0865US12165858B2Thermionic power generation element and thermionic power generation moduleTOSHIBA KK·Filed 2022·Granted Dec 10, 2024·0 cites·18 claims
- 0963US11664182B2Electron emitting element and power generation elementTOSHIBA KK·Filed 2021·Granted May 30, 2023·0 cites·20 claims
- 1058US7306985B2Method for manufacturing semiconductor device including heat treating with a flash lampSEIKO EPSON CORP·Filed 2004·Granted Dec 11, 2007·6 cites·15 claims
- 1154US8329553B2Method for manufacturing semiconductor device and NAND-type flash memoryMATSUO SHOGO·Filed 2010·Granted Dec 11, 2012·1 cites·20 claims
- 1252US7351670B2Method for producing silicon nitride films and process for fabricating semiconductor devices using said methodAIR LIQUIDE·Filed 2004·Granted Apr 1, 2008·3 cites·12 claims
- 1352US2008274605A1Method of manufacturing silicon nitride film, method of manufacturing semiconductor device, and semiconductor deviceSEMICONDUCTOR LEADING EDGE TEC·Filed 2008·Application pending·0 cites
- 1448US11855579B2Power generation elementTOSHIBA KK·Filed 2021·Granted Dec 26, 2023·0 cites·11 claims
- 1547US11805698B2Power generation element and power generation systemTOSHIBA KK·Filed 2021·Granted Oct 31, 2023·0 cites·19 claims
- 1647US10718741B2Ultrasonic flaw detecting apparatus, ultrasonic flaw detecting method, and manufacturing method of productTOSHIBA KK·Filed 2018·Granted Jul 21, 2020·0 cites·7 claims
- 1746US2006022228A1Method of manufacturing silicon nitride film, method of manufacturing semiconductor device, and semiconductor deviceTOKYO ELECTRON LTD·Filed 2005·Application pending·0 cites
- 1845US2008090988A1Method for handling polysilazane or polysilazane solution, polysilazane or polysilazane solution, and method for producing semiconductor deviceNAKAZAWA KEISUKE·Filed 2007·Application pending·0 cites
- 1942US2012034754A1Semiconductor device manufacaturing method and silicon oxide film forming methodIWASAWA KAZUAKI·Filed 2011·Application pending·0 cites
- 2039US2013160551A1Ultrasonic flaw detection device and ultrasonic flaw detection methodMIURA TAKAHIRO·Filed 2012·Application pending·0 cites
- 2136US2011284508A1Welding system and welding methodMIURA TAKAHIRO·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →