Inventor · disambiguated record
Shigenori Nagano
Also filed as: NAGANO SHIGENORI
15 granted patents·5 pending applications·44 citations·filing 1993–2022
89Inventor score
Top patents by PatentIndex Score
20 records- 0193US11614415B2Nondestructive testing system and nondestructive testing methodTOPCON CORP·Filed 2020·Granted Mar 28, 2023·5 cites·20 claims
- 0288US11754516B2Nondestructive test system comprising a neutron emission unit for emitting fast neutrons and a neutron detection unit for detecting thermal neutrons, and nondestructive test methodTOPCON CORP·Filed 2020·Granted Sep 12, 2023·2 cites·20 claims
- 0388US11513084B2Nondestructive inspecting system, and nondestructive inspecting methodTOPCON CORP·Filed 2019·Granted Nov 29, 2022·4 cites·10 claims
- 0478US9709676B2Laser light emitting device having a mode scrambler for unifying light intensity distributionKK TOPCON·Filed 2015·Granted Jul 18, 2017·2 cites·3 claims
- 0569US7309168B2Optical fiber cableTOPCON CORP·Filed 2006·Granted Dec 18, 2007·5 cites·9 claims
- 0663US12366542B2Nondestructive inspection systemTOPCON CORP·Filed 2022·Granted Jul 22, 2025·0 cites·6 claims
- 0760US9995826B2Electronic distance meterKK TOPCON·Filed 2015·Granted Jun 12, 2018·1 cites·4 claims
- 0859US12467889B2Non-destructive inspection device and non- destructive inspection systemTOPCON CORP·Filed 2022·Granted Nov 11, 2025·0 cites·8 claims
- 0956US11747288B2Non-destructive inspection system comprising neutron radiation source and neutron radiation methodTOPCON CORP·Filed 2019·Granted Sep 5, 2023·0 cites·10 claims
- 1054US2024183801A1Nondestructive inspecting deviceTOPCON CORP·Filed 2022·Application pending·0 cites
- 1151US6075600ASignal formation apparatus for use in interference measurementTOPCON CORP·Filed 1999·Granted Jun 13, 2000·14 cites·20 claims
- 1242US7561768B2Optical branching deviceTOPCON CORP·Filed 2007·Granted Jul 14, 2009·0 cites·10 claims
- 1339US6166818AInterference measurement apparatus, interference measurement probe and interference measurement control systemTOPCON CORP·Filed 1998·Granted Dec 26, 2000·8 cites·20 claims
- 1439US2004016810A1Card true/false decision apparatusFiled 2002·Application pending·0 cites
- 1537US2004031849A1Card true/false decision apparatusFiled 2002·Application pending·0 cites
- 1637US2002131597A1Card genuine judging apparatus and card genuine judging systemFiled 2001·Application pending·0 cites
- 1736US2001014191A1Interference measurement apparatus and probe used for interference measurement apparatusFiled 2001·Application pending·0 cites
- 1830US6233370B1Interference measurement apparatus and probe used for interference measurement apparatusTOPCON CORP·Filed 1998·Granted May 15, 2001·1 cites·20 claims
- 1928US5337169AMethod for patterning an optical device for optical IC, and an optical device for optical IC fabricated by this methodTOPCON CORP·Filed 1993·Granted Aug 9, 1994·0 cites·8 claims
- 2027US5349431AApparatus for measuring cross-sectional distribution of refractive index of optical waveguideTOPCON CORP·Filed 1993·Granted Sep 20, 1994·2 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →