Inventor · disambiguated record
Jody Van Horn
Also filed as: VAN HORN JODY · VAN HORN JODY J · VAN HORN JODY JOHN
15 granted patents·545 citations·filing 1995–2016
93Inventor score
Top patents by PatentIndex Score
15 records- 0198US5600257ASemiconductor wafer test and burn-inIBM·Filed 1995·Granted Feb 4, 1997·196 cites·4 claims
- 0295US6351134B2Semiconductor wafer test and burn-inIBM·Filed 1999·Granted Feb 26, 2002·127 cites·24 claims
- 0392US6618682B2Method for test optimization using historical and actual fabrication test dataIBM·Filed 2001·Granted Sep 9, 2003·88 cites·16 claims
- 0491US5929651ASemiconductor wafer test and burn-inIBM·Filed 1996·Granted Jul 27, 1999·80 cites·41 claims
- 0583US7298161B2Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliabilityIBM·Filed 2005·Granted Nov 20, 2007·10 cites·7 claims
- 0678US7759960B2Integrated circuit testing methods using well bias modificationIBM·Filed 2008·Granted Jul 20, 2010·7 cites·24 claims
- 0776US7400162B2Integrated circuit testing methods using well bias modificationIBM·Filed 2003·Granted Jul 15, 2008·17 cites·6 claims
- 0874US7564256B2Integrated circuit testing methods using well bias modificationINTERNAT BUSINESS MACHINES COM·Filed 2008·Granted Jul 21, 2009·6 cites·2 claims
- 0972US9535113B1Diversified exerciser and acceleratorIBM·Filed 2016·Granted Jan 3, 2017·2 cites·20 claims
- 1068US7486098B2Integrated circuit testing method using well bias modificationIBM·Filed 2007·Granted Feb 3, 2009·4 cites·1 claims
- 1156US7000162B2Integrated circuit phase partitioned power distribution for stress power reductionIBM·Filed 2001·Granted Feb 14, 2006·5 cites·29 claims
- 1247US9152517B2Programmable active thermal controlCHASE HAROLD·Filed 2011·Granted Oct 6, 2015·1 cites·16 claims
- 1342US6891359B2Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliabilityIBM·Filed 2003·Granted May 10, 2005·1 cites·11 claims
- 1440US7265561B2Device burn in utilizing voltage controlIBM·Filed 2003·Granted Sep 4, 2007·1 cites·12 claims
- 1535US6763314B2AC defect detection and failure avoidance power up and diagnostic systemIBM·Filed 2001·Granted Jul 13, 2004·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →