Inventor · disambiguated record
Jen-Po Huang
Also filed as: HUANG JEN-PO
8 granted patents·10 citations·filing 2010–2023
80Inventor score
Top patents by PatentIndex Score
8 records- 0187US11088285B2Oxide semiconductor field effect transistor and forming method thereofUNITED MICROELECTRONICS CORP·Filed 2018·Granted Aug 10, 2021·3 cites·11 claims
- 0287US10446689B1Manufacturing method of oxide semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2019·Granted Oct 15, 2019·4 cites·8 claims
- 0386US11631771B2Oxide semiconductor field effect transistorUNITED MICROELECTRONICS CORP·Filed 2021·Granted Apr 18, 2023·1 cites·12 claims
- 0479US12027629B2Oxide semiconductor field effect transistorUNITED MICROELECTRONICS CORP·Filed 2023·Granted Jul 2, 2024·0 cites·12 claims
- 0571US11342465B2Method of forming oxide semiconductor field effect transistorUNITED MICROELECTRONICS CORP·Filed 2021·Granted May 24, 2022·0 cites·7 claims
- 0668US9966425B1Method for fabricating a MIM capacitorUNITED MICROELECTRONICS CORP·Filed 2017·Granted May 8, 2018·1 cites·14 claims
- 0756US10446688B1Oxide semiconductor device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2018·Granted Oct 15, 2019·0 cites·8 claims
- 0851US8487644B2Method and pattern carrier for optimizing inspection recipe of defect inspection toolHUANG PONG-WEY·Filed 2010·Granted Jul 16, 2013·1 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →