Inventor · disambiguated record
Tae-Yong Jo
Also filed as: JO TAE YONG
4 granted patents·1 pending application·2 citations·filing 2014–2019
57Inventor score
Top patents by PatentIndex Score
5 records- 0165US9897486B2Method of calibrating and using a measuring apparatus that performs measurements using a spectrum of lightSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Feb 20, 2018·1 cites·20 claims
- 0259US9759665B2Panel inspecting apparatus and methodAHN MYOUNG-KI·Filed 2015·Granted Sep 12, 2017·1 cites·15 claims
- 0338US9696144B2Three-dimensional shape measuring device capable of measuring color informationSNU PRECISION CO LTD·Filed 2014·Granted Jul 4, 2017·0 cites·3 claims
- 0438US2020182777A1Substrate inspection apparatus, method of calibrating the substrate inspection apparatus, and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Application pending·0 cites
- 0532US9429525B2Optical module for surface inspection and surface inspection apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Aug 30, 2016·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →