Inventor · disambiguated record
Stefan Willkofer
Also filed as: WILLKOFER STEFAN
10 granted patents·3 pending applications·30 citations·filing 2011–2016
85Inventor score
Files withINFINEON TECHNOLOGIES AG9AHRENS CARSTEN2INFINEON TECHNOLOGIES AUSTRIA AG1WILLKOFER STEFAN1
Top patents by PatentIndex Score
13 records- 0188US9768766B2Electronic switching element and integrated sensorINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2014·Granted Sep 19, 2017·8 cites·15 claims
- 0285US8614616B2Semiconductor device and method of manufacture thereofWILLKOFER STEFAN·Filed 2011·Granted Dec 24, 2013·10 cites·14 claims
- 0383US8674800B2Semiconductor device and method of manufacture thereofINFINEON TECHNOLOGIES AG·Filed 2013·Granted Mar 18, 2014·5 cites·23 claims
- 0476US9269654B2Semiconductor device and method of manufacture thereofINFINEON TECHNOLOGIES AG·Filed 2014·Granted Feb 23, 2016·3 cites·22 claims
- 0562US9236290B2Method for producing a semiconductor deviceAHRENS CARSTEN·Filed 2012·Granted Jan 12, 2016·1 cites·21 claims
- 0659US9871126B2Discrete semiconductor transistorINFINEON TECHNOLOGIES AG·Filed 2014·Granted Jan 16, 2018·1 cites·16 claims
- 0757US9891640B2Sensing element for semiconductorINFINEON TECHNOLOGIES AG·Filed 2013·Granted Feb 13, 2018·1 cites·25 claims
- 0856US9513318B2Current or voltage sensingINFINEON TECHNOLOGIES AG·Filed 2014·Granted Dec 6, 2016·1 cites·19 claims
- 0946US2016086842A1Method for Producing a Semiconductor DeviceINFINEON TECHNOLOGIES AG·Filed 2015·Application pending·0 cites
- 1043US8932476B2Porous metal etchingINFINEON TECHNOLOGIES AG·Filed 2013·Granted Jan 13, 2015·0 cites·17 claims
- 1142US2015346037A1Integrated temperature sensorINFINEON TECHNOLOGIES AG·Filed 2014·Application pending·0 cites
- 1238US8753982B2Method for producing a connection region on a side wall of a semiconductor bodyAHRENS CARSTEN·Filed 2012·Granted Jun 17, 2014·0 cites·18 claims
- 1334US2018061660A1Barrier Layer Formation Using Thermal ProcessingINFINEON TECHNOLOGIES AG·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →