Inventor · disambiguated record
Isamu Sekihara
Also filed as: SEKIHARA ISAMU
11 granted patents·2 pending applications·233 citations·filing 2000–2013
90Inventor score
Top patents by PatentIndex Score
13 records- 0198US6734687B1Apparatus for detecting defect in device and method of detecting defectHITACHI LTD·Filed 2000·Granted May 11, 2004·134 cites·10 claims
- 0292US6960765B2Probe driving method, and probe apparatusHITACHI ULSI SYS CO LTD·Filed 2001·Granted Nov 1, 2005·50 cites·7 claims
- 0383US9362088B2Charged particle beam device and sample preparation methodHITACHI HIGH TECH CORP·Filed 2013·Granted Jun 7, 2016·6 cites·8 claims
- 0481US8455824B2Charged particle beam apparatus, and sample processing and observation methodMUTO HIROYUKI·Filed 2012·Granted Jun 4, 2013·4 cites·2 claims
- 0579US7301146B2Probe driving method, and probe apparatusHITACHI LTD·Filed 2005·Granted Nov 27, 2007·8 cites·16 claims
- 0678US6970004B2Apparatus for inspecting defects of devices and method of inspecting defectsHITACHI ULSI SYS CO LTD·Filed 2004·Granted Nov 29, 2005·18 cites·8 claims
- 0770US7989766B2Sample inspection apparatusHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 2, 2011·2 cites·17 claims
- 0868US9330883B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Granted May 3, 2016·2 cites·19 claims
- 0968US8552397B2Focused ion beam device and focused ion beam processing methodMADOKORO YUICHI·Filed 2010·Granted Oct 8, 2013·3 cites·22 claims
- 1066US7709062B2Refilling method by ion beam, instrument for fabrication and observation by ion beam, and manufacturing method of electronic deviceHITACHI HIGH TECH CORP·Filed 2002·Granted May 4, 2010·6 cites·13 claims
- 1159US2009020698A1Charged particle beam apparatus, and sample processing and observation methodHITACHI HIGH TECH CORP·Filed 2008·Application pending·0 cites
- 1235US8912487B2Charged particle beam device, position specification method used for charged particle beam device, and programSAKAMOTO KUNIO·Filed 2010·Granted Dec 16, 2014·0 cites·12 claims
- 1334US2013248733A1Charged particle beam apparatus and method of irradiating charged particle beamNOMAGUCHI TSUNENORI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →