Inventor · disambiguated record
Edward B. Harris
Also filed as: HARRIS EDWARD · HARRIS EDWARD B · HARRIS EDWARD BELDEN
36 granted patents·5 pending applications·371 citations·filing 1999–2015
97Inventor score
Files withAGERE SYSTEMS INC24HARRIS EDWARD B7AGERE SYST GUARDIAN CORP5BAIOCCHI FRANK A1CHECK JOSEPH J1
Top patents by PatentIndex Score
41 records- 0196US7259927B2Method and apparatus for improving signal-to-noise ratio for hard disk drivesAGERE SYSTEMS INC·Filed 2003·Granted Aug 21, 2007·55 cites·13 claims
- 0296US7068139B2Inductor formed in an integrated circuitAGERE SYSTEMS INC·Filed 2004·Granted Jun 27, 2006·66 cites·18 claims
- 0382US8039923B2Interdigitated capacitorsAGERE SYSTEMS INC·Filed 2009·Granted Oct 18, 2011·9 cites·6 claims
- 0482US7332924B2Embedded test circuitry and a method for testing a semiconductor device for breakdown, wearout or failureAGERE SYSTEMS INC·Filed 2005·Granted Feb 19, 2008·12 cites·17 claims
- 0580US7381607B2Method of forming a spiral inductor in a semiconductor substrateAGERE SYSTEMS INC·Filed 2006·Granted Jun 3, 2008·8 cites·1 claims
- 0678US6741147B2Method and apparatus for adjusting the resonant frequency of a thin film resonatorAGERE SYSTEMS INC·Filed 2002·Granted May 25, 2004·18 cites·20 claims
- 0776US7635888B2Interdigitated capacitorsAGERE SYSTEMS INC·Filed 2005·Granted Dec 22, 2009·6 cites·14 claims
- 0876US7022581B2Interdigitaded capacitorsAGERE SYSTEMS INC·Filed 2004·Granted Apr 4, 2006·19 cites·10 claims
- 0976US6847077B2Capacitor for a semiconductor device and method for fabrication thereforAGERE SYSTEMS INC·Filed 2002·Granted Jan 25, 2005·26 cites·15 claims
- 1076US6373087B1Methods of fabricating a metal-oxide-metal capacitor and associated apparatusesAGERE SYST GUARDIAN CORP·Filed 2000·Granted Apr 16, 2002·16 cites·6 claims
- 1175US9897319B2Igniter position for a combustor of a gas turbine engineUNITED TECHNOLOGIES CORP·Filed 2015·Granted Feb 20, 2018·2 cites·20 claims
- 1275US8566377B2Secure random number generatorHARRIS EDWARD B·Filed 2008·Granted Oct 22, 2013·10 cites·20 claims
- 1375US6498364B1Capacitor for integration with copper damascene processesAGERE SYSTEMS INC·Filed 2000·Granted Dec 24, 2002·21 cites·10 claims
- 1471US8890338B2Method of identifying and/or programming an integrated circuitHARRIS EDWARD B·Filed 2006·Granted Nov 18, 2014·5 cites·8 claims
- 1570US7457180B2Method and apparatus for storing data in a write-once non-volatile memoryAGERE SYSTEMS INC·Filed 2005·Granted Nov 25, 2008·6 cites·20 claims
- 1668US7678639B2Inductor formed in an integrated circuitAGERE SYSTEMS INC·Filed 2008·Granted Mar 16, 2010·3 cites·6 claims
- 1767US8119501B2Method for separating a semiconductor wafer into individual semiconductor dies using an implanted impurityHARRIS EDWARD B·Filed 2009·Granted Feb 21, 2012·2 cites·18 claims
- 1866US7075167B2Spiral inductor formed in a semiconductor substrateAGERE SYSTEMS INC·Filed 2003·Granted Jul 11, 2006·11 cites·19 claims
- 1964US7541238B2Inductor formed in an integrated circuitAGERE SYSTEMS INC·Filed 2006·Granted Jun 2, 2009·2 cites·10 claims
- 2063US6656850B2Method for in-situ removal of side walls in MOM capacitor formationAGERE SYSTEMS INC·Filed 2002·Granted Dec 2, 2003·7 cites·8 claims
- 2162US6570238B2Preweakened on chip metal fuse using dielectric trenches for barrier layer isolationAGERE SYSTEMS INC·Filed 2001·Granted May 27, 2003·9 cites·15 claims
- 2259US2007242383A1Method and Apparatus for Improving Signal-to-Noise Ratio for Hard Disk DrivesAGERE SYSTEMS INC·Filed 2007·Application pending·0 cites
- 2357US8242603B2Chip identification using top metal layerCHECK JOSEPH J·Filed 2007·Granted Aug 14, 2012·6 cites·20 claims
- 2455US6730601B2Methods for fabricating a metal-oxide-metal capacitorAGERE SYSTEMS INC·Filed 2002·Granted May 4, 2004·4 cites·24 claims
- 2554US8310275B2High voltage tolerant input/output interface circuitHARRIS EDWARD B·Filed 2008·Granted Nov 13, 2012·2 cites·25 claims
- 2654US8054668B2Method and apparatus for storing data in a write-once non-volatile memoryAGERE SYSTEMS INC·Filed 2008·Granted Nov 8, 2011·2 cites·22 claims
- 2753US6525358B2Capacitor having the lower electrode for preventing undesired defects at the surface of the metal plugAGERE SYSTEMS INC·Filed 2001·Granted Feb 25, 2003·3 cites·16 claims
- 2852US7977721B2High voltage tolerant metal-oxide-semiconductor deviceAGERE SYSTEMS INC·Filed 2008·Granted Jul 12, 2011·0 cites·15 claims
- 2950US6323111B1Preweakened on chip metal fuse using dielectric trenches for barrier layer isolationAGERE SYST GUARDIAN CORP·Filed 1999·Granted Nov 27, 2001·13 cites·3 claims
- 3050US6323044B1Method of forming capacitor having the lower metal electrode for preventing undesired defects at the surface of the metal plugAGERE SYST GUARDIAN CORP·Filed 1999·Granted Nov 27, 2001·13 cites·14 claims
- 3149US7135733B2Capacitor for integration with copper damascene processes and a method of manufacture thereforeAGERE SYSTEMS INC·Filed 2002·Granted Nov 14, 2006·3 cites·18 claims
- 3248US8105912B2High voltage tolerant metal-oxide-semiconductor deviceHARRIS EDWARD B·Filed 2011·Granted Jan 31, 2012·0 cites·13 claims
- 3346US6458648B1Method for in-situ removal of side walls in MOM capacitor formationAGERE SYST GUARDIAN CORP·Filed 1999·Granted Oct 1, 2002·10 cites·20 claims
- 3445US8037771B2Electronic pressure-sensing deviceLSI CORP·Filed 2009·Granted Oct 18, 2011·0 cites·20 claims
- 3543US6576563B2Method of manufacturing a semiconductor device employing a fluorine-based etch substantially free of hydrogenAGERE SYSTEMS INC·Filed 2001·Granted Jun 10, 2003·1 cites·20 claims
- 3641US2009029490A1Method of fabricating an electronic deviceBAIOCCHI FRANK A·Filed 2008·Application pending·0 cites
- 3739US2010032766A1Bipolar Junction Transistor with a Reduced Collector-Substrate CapacitanceAGERE SYSTEMS INC·Filed 2006·Application pending·0 cites
- 3838US2008072205A1Method and apparatus for designing a logic circuit using one or more circuit elements having a substantially continuous range of valuesHARRIS EDWARD B·Filed 2006·Application pending·0 cites
- 3935US8624352B2Mitigation of detrimental breakdown of a high dielectric constant metal-insulator-metal capacitor in a capacitor bankWEIR BONNIE E·Filed 2010·Granted Jan 7, 2014·0 cites·20 claims
- 4034US2006267621A1On-chip apparatus and method for determining integrated circuit stress conditionsHARRIS EDWARD B·Filed 2005·Application pending·0 cites
- 4131US6287952B1Method of etching self-aligned vias to metal using a silicon nitride spacerAGERE SYST GUARDIAN CORP·Filed 1999·Granted Sep 11, 2001·1 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →