Inventor · disambiguated record
Martin Keim
Also filed as: KEIM MARTIN
13 granted patents·1 pending application·207 citations·filing 1998–2022
91Inventor score
Files withMENTOR GRAPHICS CORP5SIEMENS AG3SIEMENS IND SOFTWARE INC3RAJSKI JANUSZ2INFINEON TECHNOLOGIES AG1
Top patents by PatentIndex Score
14 records- 0197US7512508B2Determining and analyzing integrated circuit yield and qualityRAJSKI JANUSZ·Filed 2005·Granted Mar 31, 2009·54 cites·57 claims
- 0296US7987442B2Fault dictionaries for integrated circuit yield and quality analysis methods and systemsMENTOR GRAPHICS CORP·Filed 2005·Granted Jul 26, 2011·38 cites·42 claims
- 0393US9689918B1Test access architecture for stacked memory and logic diesMENTOR GRAPHICS CORP·Filed 2013·Granted Jun 27, 2017·15 cites·18 claims
- 0489US9389944B1Test access architecture for multi-die circuitsMENTOR GRAPHICS CORP·Filed 2013·Granted Jul 12, 2016·9 cites·11 claims
- 0586US9389945B1Test access architecture for stacked diesMENTOR GRAPHICS CORP·Filed 2013·Granted Jul 12, 2016·6 cites·20 claims
- 0671US6110611AProcess for operation of a PEM fuel cell unitSIEMENS AG·Filed 1999·Granted Aug 29, 2000·44 cites·6 claims
- 0769US6432569B1Method and apparatus for monitoring a selected group of fuel cells of a high-temperature fuel cell stackSIEMENS AG·Filed 1998·Granted Aug 13, 2002·33 cites·15 claims
- 0852US12009044B2Memory built-in self-test with automated multiple step reference trimmingSIEMENS IND SOFTWARE INC·Filed 2020·Granted Jun 11, 2024·0 cites·17 claims
- 0952US10520550B2Reconfigurable scan network defect diagnosisMENTOR GRAPHICS CORP·Filed 2018·Granted Dec 31, 2019·0 cites·15 claims
- 1047US2009210183A1Determining and analyzing integrated circuit yield and qualityRAJSKI JANUSZ·Filed 2009·Application pending·0 cites
- 1146US12046315B2Memory built-in self-test with automated reference trim feedback for memory sensingSIEMENS IND SOFTWARE INC·Filed 2020·Granted Jul 23, 2024·0 cites·11 claims
- 1240US7178071B2Device for and method of examining the signal performance of semiconductor circuitsINFINEON TECHNOLOGIES AG·Filed 2002·Granted Feb 13, 2007·1 cites·36 claims
- 1337US12505896B2Memory built-in self-test with address skipping trim searchSIEMENS IND SOFTWARE INC·Filed 2022·Granted Dec 23, 2025·0 cites·18 claims
- 1433US6180271B1Method for operating a PEM fuel cell plant and PEM fuel cell plantSIEMENS AG·Filed 1999·Granted Jan 30, 2001·7 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →