Inventor · disambiguated record

Shun-Miin (Sam) Wang

Also filed as: WANG SHUN-MIIN SAM

3 granted patents·154 citations·filing 2004–2004

77Inventor score

Technology areasG01R

Files withSYNTEST TECHNOLOGIES INC3

Top patents by PatentIndex Score

3 records

0195US7032148B2Mask network design for scan-based integrated circuitsSYNTEST TECHNOLOGIES INC·Filed 2004·Granted Apr 18, 2006·84 cites·76 claims
0287US7512851B2Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2004·Granted Mar 31, 2009·39 cites·46 claims
0384US7124342B2Smart capture for ATPG (automatic test pattern generation) and fault simulation of scan-based integrated circuitsSYNTEST TECHNOLOGIES INC·Filed 2004·Granted Oct 17, 2006·31 cites·102 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →