Inventor · disambiguated record
Holger Proehl
Also filed as: PROEHL HOLGER
5 granted patents·2 pending applications·23 citations·filing 2006–2016
75Inventor score
Top patents by PatentIndex Score
7 records- 0176US8259294B2Method and device for measuring optical characteristic variables of transparent, scattering measurement objectsPROEHL HOLGER·Filed 2010·Granted Sep 4, 2012·9 cites·15 claims
- 0268US8072607B2Measuring device for measuring optical properties of transparent substratesKRAUSE JOCHEN·Filed 2007·Granted Dec 6, 2011·4 cites·23 claims
- 0367US8119194B2Infrared reflecting layer system for transparent substrateKOEKERT CHRISTOPH·Filed 2007·Granted Feb 21, 2012·8 cites·14 claims
- 0466US7443518B2Measuring instrument, in particular for transmission measurement in vacuum systemARDENNE ANLAGENTECH GMBH·Filed 2006·Granted Oct 28, 2008·2 cites·6 claims
- 0548US2011139067A1Arrangement for coating tape-shaped film substratesARDENNE ANLAGENTECH GMBH·Filed 2009·Application pending·0 cites
- 0647US8377578B2Infrared reflecting layer system for transparent substrateARDENNE ANLAGENTECH GMBH·Filed 2012·Granted Feb 19, 2013·0 cites·18 claims
- 0741US2016273102A1Tape-substrate coating line having a magnetron arrangementARDENNE GMBH VON·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →