Inventor · disambiguated record
David Ma
Also filed as: MA DAVID · MA DAVID S · MA DAVID SUITWAI
17 granted patents·1 pending application·234 citations·filing 2002–2007
93Inventor score
Top patents by PatentIndex Score
18 records- 0193US7079441B1Methods and apparatus for implementing a power down in a memory deviceINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 18, 2006·79 cites·26 claims
- 0292US6721180B2Cooling hood for circuit boardINFINEON TECHNOLOGIES AG·Filed 2002·Granted Apr 13, 2004·65 cites·21 claims
- 0387US7119567B2System and method for testing one or more dies on a semiconductor waferINFINEON TECHNOLOGIES CORP·Filed 2002·Granted Oct 10, 2006·29 cites·15 claims
- 0482US7449909B2System and method for testing one or more dies on a semiconductor waferINFINEON TECHNOLOGIES AG·Filed 2007·Granted Nov 11, 2008·11 cites·6 claims
- 0582US7277350B2Implementation of a fusing scheme to allow internal voltage trimmingINFINEON TECHNOLOGIES AG·Filed 2005·Granted Oct 2, 2007·13 cites·12 claims
- 0678US7242208B2System and method for testing one or more dies on a semiconductor waferINFINEON TECHNOLOGIES AG·Filed 2006·Granted Jul 10, 2007·7 cites·6 claims
- 0766US7643956B2Continuous self-calibration of internal analog signalsINFINEON TECHNOLOGIES AG·Filed 2007·Granted Jan 5, 2010·3 cites·17 claims
- 0854US6667919B1Semiconductor memory device and test method thereof using row compression test modeINFINEON TECHNOLOGIES AG·Filed 2002·Granted Dec 23, 2003·9 cites·24 claims
- 0952US7539075B2Implementation of a fusing scheme to allow internal voltage trimmingINFINEON TECHNOLOGIES AG·Filed 2007·Granted May 26, 2009·2 cites·13 claims
- 1051US7177373B2Continuous self-calibration of internal analog signalsINFINEON TECHNOLOGIES AG·Filed 2002·Granted Feb 13, 2007·2 cites·5 claims
- 1148US6845048B2System and method for monitoring internal voltages on an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jan 18, 2005·6 cites·15 claims
- 1244US7330040B2Test circuitry waferINFINEON TECHNOLOGIES AG·Filed 2004·Granted Feb 12, 2008·2 cites·18 claims
- 1342US6903982B2Bit line segmenting in random access memoriesINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jun 7, 2005·4 cites·20 claims
- 1438US6754113B2Topography correction for testing of redundant array elementsINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jun 22, 2004·2 cites·20 claims
- 1537US7071724B2Wafer probecard interfaceINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jul 4, 2006·0 cites·18 claims
- 1634US2004051550A1Semiconductor die isolation systemFiled 2002·Application pending·0 cites
- 1732US7305594B2Integrated circuit in a maximum input/output configurationINFINEON TECHNOLOGIES AG·Filed 2002·Granted Dec 4, 2007·0 cites·22 claims
- 1832US6702589B1Leadless socket for decapped semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 9, 2004·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →