Inventor · disambiguated record
Eiichi Shinohara
Also filed as: SHINOHARA EIICHI
10 granted patents·581 citations·filing 2007–2014
86Inventor score
Top patents by PatentIndex Score
10 records- 0197USD609652SWafer attracting plateTOKYO ELECTRON LTD·Filed 2009·Granted Feb 9, 2010·567 cites·1 claims
- 0276US9562942B2Probe apparatusTOKYO ELECTRON LTD·Filed 2014·Granted Feb 7, 2017·3 cites·18 claims
- 0374US9347970B2Probe apparatusSHINOHARA EIICHI·Filed 2012·Granted May 24, 2016·4 cites·4 claims
- 0467US9638719B2Probe device having cleaning mechanism for cleaning connection conductorTOKYO ELECTRON LTD·Filed 2014·Granted May 2, 2017·2 cites·4 claims
- 0566US9759762B2Probe deviceTOKYO ELECTRON LTD·Filed 2014·Granted Sep 12, 2017·2 cites·14 claims
- 0657US9322844B2Probe card for power deviceSHINOHARA EIICHI·Filed 2012·Granted Apr 26, 2016·1 cites·9 claims
- 0756US9658285B2Probe apparatusKOUNO ISAO·Filed 2011·Granted May 23, 2017·2 cites·3 claims
- 0844US7859279B2Charge eliminating apparatus and method, and program storage mediumTOKYO ELECTRON LTD·Filed 2007·Granted Dec 28, 2010·0 cites·6 claims
- 0943US9261553B2Probe apparatusTOKYO ELECTRON LTD·Filed 2014·Granted Feb 16, 2016·0 cites·14 claims
- 1039US8085052B2Charge eliminating apparatus and method, and program storage medium for removing static electricity from a target object such as a waferSHINOHARA EIICHI·Filed 2010·Granted Dec 27, 2011·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when Eiichi Shinohara files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →